ESD currents and fields on the VCP and the HCP modeled using quasi-static approximations

David J. Pommerenke; Thomas P. Van Doren; Wang Kai

ESD currents and fields on the VCP and the HCP modeled using quasi-static approximations

David J. Pommerenke^*, Thomas P. Van Doren, Wang Kai

^*Corresponding author for this work

Research output: Contribution to journal › Conference article › peer-review

Abstract

The horizontal coupling plane (HCP) and the vertical coupling plane (VCP) are essential elements of the standardized electrostatic discharge (ESD) test. They are used for testing the robustness of equipment against indirect (nearby) discharges. This article analyzed the current and the fields on the HCP and the VCP using plane wave, transmission line, quasi-static theory. The objective is to illustrate the dominating physical processes on these planes. The work is based on measurements of the transient currents and fields using broadband sensors.

Original language	English
Pages (from-to)	81-86
Number of pages	6
Journal	IEEE International Symposium on Electromagnetic Compatibility
Volume	1
Publication status	Published - 1 Jan 2002
Externally published	Yes
Event	IEEE International Symposium on Electromagnetic Compatibility: EMC 2002 - Minneapolis, United States Duration: 19 Aug 2002 → 23 Aug 2002

Keywords

Electrostatic discharge
Susceptibility
Transient fields

ASJC Scopus subject areas

Condensed Matter Physics
Electrical and Electronic Engineering

Cite this

@article{367f90b5c6404d978f615890768b0318,

title = "ESD currents and fields on the VCP and the HCP modeled using quasi-static approximations",

abstract = "The horizontal coupling plane (HCP) and the vertical coupling plane (VCP) are essential elements of the standardized electrostatic discharge (ESD) test. They are used for testing the robustness of equipment against indirect (nearby) discharges. This article analyzed the current and the fields on the HCP and the VCP using plane wave, transmission line, quasi-static theory. The objective is to illustrate the dominating physical processes on these planes. The work is based on measurements of the transient currents and fields using broadband sensors.",

keywords = "Electrostatic discharge, Susceptibility, Transient fields",

author = "Pommerenke, {David J.} and {Van Doren}, {Thomas P.} and Wang Kai",

year = "2002",

month = jan,

day = "1",

language = "English",

volume = "1",

pages = "81--86",

journal = "IEEE International Symposium on Electromagnetic Compatibility",

issn = "0190-1494",

publisher = "Institute of Electrical and Electronics Engineers",

note = "IEEE International Symposium on Electromagnetic Compatibility : EMC 2002 ; Conference date: 19-08-2002 Through 23-08-2002",

}

TY - JOUR

T1 - ESD currents and fields on the VCP and the HCP modeled using quasi-static approximations

AU - Pommerenke, David J.

AU - Van Doren, Thomas P.

AU - Kai, Wang

PY - 2002/1/1

Y1 - 2002/1/1

N2 - The horizontal coupling plane (HCP) and the vertical coupling plane (VCP) are essential elements of the standardized electrostatic discharge (ESD) test. They are used for testing the robustness of equipment against indirect (nearby) discharges. This article analyzed the current and the fields on the HCP and the VCP using plane wave, transmission line, quasi-static theory. The objective is to illustrate the dominating physical processes on these planes. The work is based on measurements of the transient currents and fields using broadband sensors.

AB - The horizontal coupling plane (HCP) and the vertical coupling plane (VCP) are essential elements of the standardized electrostatic discharge (ESD) test. They are used for testing the robustness of equipment against indirect (nearby) discharges. This article analyzed the current and the fields on the HCP and the VCP using plane wave, transmission line, quasi-static theory. The objective is to illustrate the dominating physical processes on these planes. The work is based on measurements of the transient currents and fields using broadband sensors.

KW - Electrostatic discharge

KW - Susceptibility

KW - Transient fields

UR - http://www.scopus.com/inward/record.url?scp=0036382265&partnerID=8YFLogxK

M3 - Conference article

AN - SCOPUS:0036382265

SN - 0190-1494

VL - 1

SP - 81

EP - 86

JO - IEEE International Symposium on Electromagnetic Compatibility

JF - IEEE International Symposium on Electromagnetic Compatibility

T2 - IEEE International Symposium on Electromagnetic Compatibility

Y2 - 19 August 2002 through 23 August 2002

ER -

ESD currents and fields on the VCP and the HCP modeled using quasi-static approximations

Abstract

Keywords

ASJC Scopus subject areas

Other files and links

Cite this