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Abstract
Extensive knowledge of the protection device's behavior under electrostatic discharge stress is mandatory to characterize protective elements and systems. This paper gives a brief overview on different electrostatic discharge protection concepts, including general considerations on diverting stress, trigger mechanisms, and their limitations. The protection approaches have to be selected in conjunction with the operational signals to avoid malfunction, increased power consumption, or physical failure. The Wunsch-Bell model is extended by means of an additional axis incorporating the rise time to better characterize different protective circuitry from component- to system-level. This allows for more accurate prediction of system robustness possibly preventing costly re-designs.
Original language | English |
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DOIs | |
Publication status | Published - 27 Jun 2016 |
Event | 12th Conference on Ph.D. Research in Microelectronics and Electronics: PRIME 2016 - Lissabon, Portugal Duration: 27 Jun 2016 → 30 Jun 2016 |
Conference
Conference | 12th Conference on Ph.D. Research in Microelectronics and Electronics |
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Abbreviated title | PRIME 2016 |
Country/Territory | Portugal |
City | Lissabon |
Period | 27/06/16 → 30/06/16 |
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Dive into the research topics of 'ESD protection characterization by an extended Wunsch-Bell plot'. Together they form a unique fingerprint.Activities
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12th Conference on Ph.D. Research in Microelectronics and Electronics
Patrick Schrey (Participant)
27 Jun 2016 → 30 Jun 2016Activity: Participation in or organisation of › Conference or symposium (Participation in/Organisation of)
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ESD protection characterization by an extended Wunsch-Bell plot
Patrick Schrey (Speaker)
Jun 2016Activity: Talk or presentation › Talk at conference or symposium › Science to science