Abstract
ESD susceptibility scanning is an effective method to find the causes of ESD soft failures in electronic systems. A local probe is used to scan the system for sensitive areas. However, the voltages induced by the probe are often unknown. This paper quantifies the induced voltages from different probes when injected into traces and flex cables, and compares the values to the induced voltages caused by an IEC 61000-4-2 ESD gun in contact mode. The goal is to guide the reader to select voltage levels and probes during susceptibility scans in a way that avoids levels that may be associated with ESD gun injection and cause failure.
| Original language | English |
|---|---|
| Title of host publication | 2021 Joint IEEE International Symposium on Electromagnetic Compatibility Signal and Power Integrity, and EMC Europe, EMC/SI/PI/EMC Europe 2021 |
| Publisher | IEEE Publications |
| Pages | 1018-1023 |
| Number of pages | 6 |
| ISBN (Electronic) | 9781665448888 |
| ISBN (Print) | 978-1-6654-4889-5 |
| DOIs | |
| Publication status | Published - 26 Jul 2021 |
| Event | 2021 Joint IEEE International Symposium on Electromagnetic Compatibility Signal and Power Integrity, and EMC Europe: EMC/SI/PI/EMC Europe 2021 - Raleigh, United States Duration: 26 Jul 2021 → 20 Aug 2021 |
Conference
| Conference | 2021 Joint IEEE International Symposium on Electromagnetic Compatibility Signal and Power Integrity, and EMC Europe |
|---|---|
| Abbreviated title | EMC/SI/PI/EMC Europe 2021 |
| Country/Territory | United States |
| City | Raleigh |
| Period | 26/07/21 → 20/08/21 |
Keywords
- Couplings
- Flexible printed circuits
- Electrostatic discharges
- Communication cables
- Pins
- Magnetic fields
- Probes
- ESD soft failures
- traces and flex cables
- IEC 61000-4-2 ESD gun
- ESD susceptibility scanning
ASJC Scopus subject areas
- Aerospace Engineering
- Safety, Risk, Reliability and Quality
- Signal Processing
- Energy Engineering and Power Technology
- Radiation
- Electrical and Electronic Engineering