Experimental Characterization of Microvias Using TRL Calibration with Uncertainty Analysis

Hiroaki Takahashi; Ziad Hatab; Erich Schlaffer; Helmut Paulitsch; Wolfgang Bösch

doi:10.23919/APMC55665.2022.9999955

Experimental Characterization of Microvias Using TRL Calibration with Uncertainty Analysis

Hiroaki Takahashi, Ziad Hatab, Erich Schlaffer, Helmut Paulitsch, Wolfgang Bösch

Institute of Microwave and Photonic Engineering (4510)

Research output: Chapter in Book/Report/Conference proceeding › Conference paper › peer-review

Abstract

In this paper, we present an experimental characterization of microvias implemented in a multilayer printed circuit board (PCB). Using thru-reflect-line (TRL) calibration, we characterized the transmission lines connecting to the microvias and extracted the corresponding S-parameters of the microvias. Subsequently, the microvia inductance and capacitance, up to 14 GHz, were determined from the corresponding ABCD-parameters. We evaluated the measurement results with a 95 % confidence interval by an uncertainty analysis and compared it to a full-wave electromagnetic (EM) simulation. Measurement and simulation show excellent agreement in both inductance and capacitance across the investigated frequency range.

Original language	English
Title of host publication	2022 Asia-Pacific Microwave Conference (APMC)
Publisher	IEEE Xplore
Pages	411-413
Number of pages	3
ISBN (Print)	978-1-6654-5108-6
DOIs	https://doi.org/10.23919/APMC55665.2022.9999955
Publication status	Published - 2 Dec 2022
Event	Asian Pacific Microwave Conference 2022: APMC 2022 - Pacifico YOKOHAMA, Yokohama, Japan Duration: 29 Nov 2022 → 2 Dec 2022 https://apmc2022.org/

Conference

Conference	Asian Pacific Microwave Conference 2022
Abbreviated title	APMC 2022
Country/Territory	Japan
City	Yokohama
Period	29/11/22 → 2/12/22
Internet address	https://apmc2022.org/

Access to Document

10.23919/APMC55665.2022.9999955

https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=9999955

Cite this

@inproceedings{314ccb86f9b74ff7b9ef4fc73925dc21,

title = "Experimental Characterization of Microvias Using TRL Calibration with Uncertainty Analysis",

abstract = "In this paper, we present an experimental characterization of microvias implemented in a multilayer printed circuit board (PCB). Using thru-reflect-line (TRL) calibration, we characterized the transmission lines connecting to the microvias and extracted the corresponding S-parameters of the microvias. Subsequently, the microvia inductance and capacitance, up to 14 GHz, were determined from the corresponding ABCD-parameters. We evaluated the measurement results with a 95 % confidence interval by an uncertainty analysis and compared it to a full-wave electromagnetic (EM) simulation. Measurement and simulation show excellent agreement in both inductance and capacitance across the investigated frequency range.",

keywords = "Microwave measurement, Inductance, Analytical models, Uncertainty, Printed circuits, Transmission line measurements, Capacitance",

author = "Hiroaki Takahashi and Ziad Hatab and Erich Schlaffer and Helmut Paulitsch and Wolfgang B{\"o}sch",

year = "2022",

month = dec,

day = "2",

doi = "10.23919/APMC55665.2022.9999955",

language = "English",

isbn = "978-1-6654-5108-6",

pages = "411--413",

booktitle = "2022 Asia-Pacific Microwave Conference (APMC)",

publisher = "IEEE Xplore",

note = "Asian Pacific Microwave Conference 2022 : APMC 2022, APMC 2022 ; Conference date: 29-11-2022 Through 02-12-2022",

url = "https://apmc2022.org/",

}

TY - GEN

T1 - Experimental Characterization of Microvias Using TRL Calibration with Uncertainty Analysis

AU - Takahashi, Hiroaki

AU - Hatab, Ziad

AU - Schlaffer, Erich

AU - Paulitsch, Helmut

AU - Bösch, Wolfgang

PY - 2022/12/2

Y1 - 2022/12/2

N2 - In this paper, we present an experimental characterization of microvias implemented in a multilayer printed circuit board (PCB). Using thru-reflect-line (TRL) calibration, we characterized the transmission lines connecting to the microvias and extracted the corresponding S-parameters of the microvias. Subsequently, the microvia inductance and capacitance, up to 14 GHz, were determined from the corresponding ABCD-parameters. We evaluated the measurement results with a 95 % confidence interval by an uncertainty analysis and compared it to a full-wave electromagnetic (EM) simulation. Measurement and simulation show excellent agreement in both inductance and capacitance across the investigated frequency range.

AB - In this paper, we present an experimental characterization of microvias implemented in a multilayer printed circuit board (PCB). Using thru-reflect-line (TRL) calibration, we characterized the transmission lines connecting to the microvias and extracted the corresponding S-parameters of the microvias. Subsequently, the microvia inductance and capacitance, up to 14 GHz, were determined from the corresponding ABCD-parameters. We evaluated the measurement results with a 95 % confidence interval by an uncertainty analysis and compared it to a full-wave electromagnetic (EM) simulation. Measurement and simulation show excellent agreement in both inductance and capacitance across the investigated frequency range.

KW - Microwave measurement

KW - Inductance

KW - Analytical models

KW - Uncertainty

KW - Printed circuits

KW - Transmission line measurements

KW - Capacitance

UR - https://ieeexplore.ieee.org/document/9999955/

U2 - 10.23919/APMC55665.2022.9999955

DO - 10.23919/APMC55665.2022.9999955

M3 - Conference paper

SN - 978-1-6654-5108-6

SP - 411

EP - 413

BT - 2022 Asia-Pacific Microwave Conference (APMC)

PB - IEEE Xplore

T2 - Asian Pacific Microwave Conference 2022

Y2 - 29 November 2022 through 2 December 2022

ER -

Experimental Characterization of Microvias Using TRL Calibration with Uncertainty Analysis

Abstract

Conference

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Experimental Characterization of Microvias Using TRL Calibration with Uncertainty Analysis

Abstract

Conference

Access to Document

Other files and links

Fingerprint

Projects

CD-Laboratory for Technology guided electronic component design and characterization

UltimateGaN - Research for GaN technologies, devices and applications to address the challenges of the future GaN roadmap

Cite this