Abstract
A novel method to extract dispersive properties for dielectrics over a wide frequency range is proposed. This method is based on measuring scattering parameters for planar transmission lines and applying genetic algorithms. The scattering parameters are converted into ABCD matrix parameters. The complex propagation constant of the TEM wave inside the line is obtained from A-parameters of the ABCD matrix. For planar transmission lines, analytical or empirical formulas for dielectric loss, conductor loss, and phase constant are known. The genetic algorithm is then used to extract the Debye parameters for the dielectric substrates. FDTD modeling is used to verify the dispersive parameter extraction by comparing with the measurement
Original language | English |
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Title of host publication | 2006 IEEE Instrumentation and Measurement Technology Conference Proceedings |
Pages | 462-467 |
ISBN (Electronic) | 0780393600, 978-078039360-8 |
DOIs | |
Publication status | Published - 1 Jan 2006 |
Externally published | Yes |
Event | 23rd IEEE International Instrumentation and Measurement Technology Conference: IMTC 2006 - Sorrento, Italy Duration: 24 Apr 2006 → 27 Apr 2006 |
Conference
Conference | 23rd IEEE International Instrumentation and Measurement Technology Conference |
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Abbreviated title | I2MTC 2006 |
Country/Territory | Italy |
City | Sorrento |
Period | 24/04/06 → 27/04/06 |
Keywords
- Debye dispersion law
- S-parameter measurement
- Conduction loss
- Dielectric loss
- Genetic algorithm
- Planar structure transmission lines