Extraction of dispersive material parameters using vector network analyzers and genetic algorithms

JM Zhang, Marina Y. Koledintseva, DP Pommerenke, James L. Drewniak, Konstantin N. Rozanov, G Antonini, A Orlandi

Research output: Chapter in Book/Report/Conference proceedingConference paperpeer-review

Abstract

A novel method to extract dispersive properties for dielectrics over a wide frequency range is proposed. This method is based on measuring scattering parameters for planar transmission lines and applying genetic algorithms. The scattering parameters are converted into ABCD matrix parameters. The complex propagation constant of the TEM wave inside the line is obtained from A-parameters of the ABCD matrix. For planar transmission lines, analytical or empirical formulas for dielectric loss, conductor loss, and phase constant are known. The genetic algorithm is then used to extract the Debye parameters for the dielectric substrates. FDTD modeling is used to verify the dispersive parameter extraction by comparing with the measurement
Original languageEnglish
Title of host publication2006 IEEE Instrumentation and Measurement Technology Conference Proceedings
Pages462-467
ISBN (Electronic)0780393600, 978-078039360-8
DOIs
Publication statusPublished - 1 Jan 2006
Externally publishedYes
Event23rd IEEE International Instrumentation and Measurement Technology Conference: IMTC 2006 - Sorrento, Italy
Duration: 24 Apr 200627 Apr 2006

Conference

Conference23rd IEEE International Instrumentation and Measurement Technology Conference
Abbreviated titleI2MTC 2006
Country/TerritoryItaly
CitySorrento
Period24/04/0627/04/06

Keywords

  • Debye dispersion law
  • S-parameter measurement
  • Conduction loss
  • Dielectric loss
  • Genetic algorithm
  • Planar structure transmission lines

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