FEM-based Computation of circuit parameters for testing fast transients for EMC problems

Susanne Bauer; Werner Renhart; Oszkar Biro

doi:10.1109/CEFC.2016.7816252

FEM-based Computation of circuit parameters for testing fast transients for EMC problems

Susanne Bauer, Werner Renhart, Oszkar Biro

Institute of Fundamentals and Theory in Electrical Engineering (4370)

Research output: Chapter in Book/Report/Conference proceeding › Conference paper › peer-review

Abstract

This contribution outlines the extraction of circuit parameters with 3D finite elements from the standardized electromagnetic compatibility (EMC) measurement setup of the capacitive coupling clamp that is utilized for immunity tests against fast transients.

Original language	English
Title of host publication	IEEE CEFC 2016 - 17th Biennial Conference on Electromagnetic Field Computation
Publisher	Institute of Electrical and Electronics Engineers
ISBN (Electronic)	9781509010325
DOIs	https://doi.org/10.1109/CEFC.2016.7816252
Publication status	Published - 12 Jan 2017
Event	17th Biennial IEEE Conference on Electromagnetic Field Computation, IEEE CEFC 2016 - Miami, United States Duration: 13 Nov 2016 → 16 Nov 2016

Conference

Conference	17th Biennial IEEE Conference on Electromagnetic Field Computation, IEEE CEFC 2016
Country/Territory	United States
City	Miami
Period	13/11/16 → 16/11/16

Keywords

Eddy currents
Electrostatics
EMC
FEM

ASJC Scopus subject areas

Computational Mathematics
Instrumentation
Electrical and Electronic Engineering

Access to Document

10.1109/CEFC.2016.7816252

Cite this

FEM-based Computation of circuit parameters for testing fast transients for EMC problems. / Bauer, Susanne; Renhart, Werner ; Biro, Oszkar.
IEEE CEFC 2016 - 17th Biennial Conference on Electromagnetic Field Computation. Institute of Electrical and Electronics Engineers, 2017. 7816252.

Research output: Chapter in Book/Report/Conference proceeding › Conference paper › peer-review

Bauer, S, Renhart, W & Biro, O 2017, FEM-based Computation of circuit parameters for testing fast transients for EMC problems. in IEEE CEFC 2016 - 17th Biennial Conference on Electromagnetic Field Computation., 7816252, Institute of Electrical and Electronics Engineers, 17th Biennial IEEE Conference on Electromagnetic Field Computation, IEEE CEFC 2016, Miami, United States, 13/11/16. https://doi.org/10.1109/CEFC.2016.7816252

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AB - This contribution outlines the extraction of circuit parameters with 3D finite elements from the standardized electromagnetic compatibility (EMC) measurement setup of the capacitive coupling clamp that is utilized for immunity tests against fast transients.

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FEM-based Computation of circuit parameters for testing fast transients for EMC problems

Abstract

Conference

Keywords

ASJC Scopus subject areas

Access to Document

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