Field injection probes for field coupled electrostatic discharge sensitivity database of ICs

Zhen Li*, Jiang Xiao, Byongsu Seol, Jongsung Lee, David Pommerenke

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference paperpeer-review


An ESD (Electrostatic Discharge) sensitivity database gives a guidance in estimating if, for a given ESD scenario and IC location soft-error (e.g., resets) problems are likely to occur or not. This paper reports on the field probes used.

Original languageEnglish
Title of host publicationIEEE International Symposium on Electromagnetic Compatibility, EMC 2010 - Final Program
Number of pages5
Publication statusPublished - 1 Dec 2010
Externally publishedYes
Event2010 IEEE International Symposium on Electromagnetic Compatibility: EMC 2010 - Fort Lauderdale, United States
Duration: 25 Jul 201030 Jul 2010

Publication series

NameIEEE International Symposium on Electromagnetic Compatibility
ISSN (Print)1077-4076


Conference2010 IEEE International Symposium on Electromagnetic Compatibility
Country/TerritoryUnited States
CityFort Lauderdale

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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