@inproceedings{ec0000b84cf844dca781739a0f5355f0,
title = "Focused diagnosis for failing Software Tests",
abstract = "Ranging from firmware to cloud services, software is an essential part of almost any imaginable system, or at the very least assists us in their design or maintenance. The sheer complexity and sophisticated concepts of today{\textquoteright}s software products thus demand for solutions that assist us in assuring their quality. We aim to contribute in this direction by proposing a fault localization approach for failing test cases that draws on mode based diagnosis techniques from the AI community and focuses the search on dynamic executions. With this focus, we offer the scalability needed to consider also designs like service oriented architectures (SOAs). Furthermore, we opt for a flexible approach that allows a user to refine the reasoning by annotating our basic structure of a control flow graph with further information, e.g., for black box components. First experiments with standard software examples, as well as examples taken from the SOA domain show promising results.",
keywords = "Constraint satisfaction problem, Control flow graph, Model-based diagnosis, Software debugging",
author = "Birgit Hofer and Seema Jehan and Ingo Pill and Franz Wotawa",
year = "2015",
month = jan,
day = "1",
doi = "10.1007/978-3-319-19066-2_69",
language = "English",
isbn = "9783319190655",
series = "Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)",
publisher = "Springer-Verlag Italia",
pages = "712--721",
editor = "Chang-Hwan Lee and Yongdai Kim and Kwon, {Young Sig} and Juntae Kim and Moonis Ali",
booktitle = "Current Approaches in Applied Artificial Intelligence - 28th International Conference on Industrial, Engineering and Other Applications of Applied Intelligent Systems, IEA/AIE 2015, Proceedings",
address = "Italy",
note = "28th International Conference on Industrial, Engineering and Other Applications of Applied Intelligent Systems, IEA/AIE 2015 ; Conference date: 10-06-2015 Through 12-06-2015",
}