Focused electron beam induced deposition as a tool to create electron vortices

A. Beche; Robert Winkler; Harald Plank; Ferdinand Hofer; J. Verbeeck

doi:http://dx.doi.org/10.1016/j.micron.2015.07.011

Focused electron beam induced deposition as a tool to create electron vortices

A. Beche, Robert Winkler, Harald Plank, Ferdinand Hofer, J. Verbeeck

Institute of Electron Microscopy and Nanoanalysis (5190)

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	34-38
Journal	Micron
Volume	80
DOIs	https://doi.org/10.1016/j.micron.2015.07.011
Publication status	Published - 2016

Fields of Expertise

Advanced Materials Science

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http://dx.doi.org/10.1016/j.micron.2015.07.011

SENTINEL - Self-Sensing Nanoprobes for Electric and Thermal In-Situ Characterization in Electron Microscopes
Plank, H.
1/10/15 → 30/09/17
Project: Research project
Functional Nanofabrication
Dohr, J., Plank, H., Rosker, S., Winkler, R., Stermitz, M., Reisecker, V., Michelitsch, S. G. W., Brugger-Hatzl, M., Schmied, R., Eicher, B., Orthacker, A., Arnold, G., Sattelkow, J., Kolb, F., Ganner, T., Haselmann, U., Seewald, L. & Aschl, T.
1/01/09 → 31/12/23
Project: Research project

Cite this

@article{db145a8f70fd43ce9d67daeec1e9faf4,

title = "Focused electron beam induced deposition as a tool to create electron vortices",

author = "A. Beche and Robert Winkler and Harald Plank and Ferdinand Hofer and J. Verbeeck",

year = "2016",

doi = "http://dx.doi.org/10.1016/j.micron.2015.07.011",

language = "English",

volume = "80",

pages = "34--38",

journal = "Micron",

issn = "0968-4328",

publisher = "Elsevier Limited",

}

TY - JOUR

T1 - Focused electron beam induced deposition as a tool to create electron vortices

AU - Beche, A.

AU - Winkler, Robert

AU - Plank, Harald

AU - Hofer, Ferdinand

AU - Verbeeck, J.

PY - 2016

Y1 - 2016

U2 - http://dx.doi.org/10.1016/j.micron.2015.07.011

DO - http://dx.doi.org/10.1016/j.micron.2015.07.011

M3 - Article

SN - 0968-4328

VL - 80

SP - 34

EP - 38

JO - Micron

JF - Micron

ER -

Focused electron beam induced deposition as a tool to create electron vortices

Fields of Expertise

Treatment code (Nähere Zuordnung)

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Projects

SENTINEL - Self-Sensing Nanoprobes for Electric and Thermal In-Situ Characterization in Electron Microscopes

Functional Nanofabrication

Cite this