Focused Ion Beam Preparation for Transmission Electron Microscopy

Research output: Chapter in Book/Report/Conference proceeding › Conference paper › peer-review

Original language	English
Title of host publication	Multinational Congress on Microscopy
Publisher	.
Pages	O-135-101-103
Publication status	Published - 2015
Event	Multinational Congress on Microscopy - Eger, Hungary Duration: 23 Aug 2015 → 28 Aug 2015

Conference	Multinational Congress on Microscopy
Country/Territory	Hungary
City	Eger
Period	23/08/15 → 28/08/15

Fields of Expertise

@inproceedings{dae59dd0e1874891b33e44bf63bdabdd,

title = "Focused Ion Beam Preparation for Transmission Electron Microscopy",

author = "Martina Dienstleder and Christian Gspan and Gerald Kothleitner and Ferdinand Hofer",

year = "2015",

language = "English",

pages = "O--135--101--103",

booktitle = "Multinational Congress on Microscopy",

publisher = ".",

note = "Multinational Congress on Microscopy ; Conference date: 23-08-2015 Through 28-08-2015",

}

TY - GEN

T1 - Focused Ion Beam Preparation for Transmission Electron Microscopy

AU - Dienstleder, Martina

AU - Gspan, Christian

AU - Kothleitner, Gerald

AU - Hofer, Ferdinand

PY - 2015

Y1 - 2015

M3 - Conference paper

SP - O-135-101-103

BT - Multinational Congress on Microscopy

PB - .

T2 - Multinational Congress on Microscopy

Y2 - 23 August 2015 through 28 August 2015

ER -