Focusing Elements and Design Considerations for a Scanning Helium Microscope (SHeM)

D. A. MacLaren, Bodil Holst, D Riley, W. Allison

Research output: Contribution to journalArticlepeer-review

Original languageEnglish
Pages (from-to)249-255
JournalSurface Science
Volume10
Publication statusPublished - 2003

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