Framework to Simulate and Analyse the Electromagnetic Emission of Integrated Circuits under Electromagnetic Interference

Dominik Zupan; Daniel Kircher; Nikolaus Czepl; Bernd Deutschmann

doi:10.1109/SMACD58065.2023.10192236

Framework to Simulate and Analyse the Electromagnetic Emission of Integrated Circuits under Electromagnetic Interference

Dominik Zupan, Daniel Kircher, Nikolaus Czepl, Bernd Deutschmann

Institute of Electronics (4390)

Research output: Chapter in Book/Report/Conference proceeding › Conference paper › peer-review

Abstract

Ensuring the safe operation of electronic systems requires them to comply with electromagnetic compatibility (EMC) regulations. We can achieve this by conducting various EMC tests, including checking electromagnetic emission limits and immunity to interference signals, both on integrated circuit (IC) and on system level. However, these tests are typically performed separately, without considering the potential impact of one test on another. In this paper we present a framework to address this issue by simulation and subsequent post-processing. We focus on the impact of radio frequency (RF) disturbances on the electromagnetic emission of an IC, and propose a framework based on LTspice and Python, that implements the direct power injection (DPI) characterisation method and the 150 Ohm method. Within this paper we demonstrate the usability of this framework and how the resulting plot can support circuit designers in developing EMC compliant circuits. To do so, we utilise a test circuit, where the electromagnetic emission is significantly altered by an RF disturbance.

Original language	English
Title of host publication	2023 19th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD)
Publisher	ACM/IEEE
Number of pages	4
ISBN (Electronic)	9798350332650
ISBN (Print)	979-8-3503-3284-1
DOIs	https://doi.org/10.1109/SMACD58065.2023.10192236
Publication status	Published - 5 Jul 2023
Event	2023 19th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design: SMACD 2023 - Funchal, Portugal Duration: 3 Jul 2023 → 5 Jul 2023

Conference

Conference	2023 19th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design
Abbreviated title	SMACD 2023
Country/Territory	Portugal
City	Funchal
Period	3/07/23 → 5/07/23

Keywords

Combined EMC testing
Direct Power Injection (DPI)
Electromagnetic Compatibility (EMC)
Electromagnetic Interference (EMI)
IEC 61967
IEC 62132
Radio Frequency Interference (RFI)
Simulation Framework

ASJC Scopus subject areas

Instrumentation
Electrical and Electronic Engineering
Computer Graphics and Computer-Aided Design
Modelling and Simulation

Access to Document

10.1109/SMACD58065.2023.10192236

Cite this

Zupan, D., Kircher, D., Czepl, N., & Deutschmann, B. (2023). Framework to Simulate and Analyse the Electromagnetic Emission of Integrated Circuits under Electromagnetic Interference. In 2023 19th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD) Article 10192236 ACM/IEEE. https://doi.org/10.1109/SMACD58065.2023.10192236

Framework to Simulate and Analyse the Electromagnetic Emission of Integrated Circuits under Electromagnetic Interference. / Zupan, Dominik ; Kircher, Daniel ; Czepl, Nikolaus et al.
2023 19th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD). ACM/IEEE, 2023. 10192236.

Research output: Chapter in Book/Report/Conference proceeding › Conference paper › peer-review

Zupan, D , Kircher, D , Czepl, N & Deutschmann, B 2023, Framework to Simulate and Analyse the Electromagnetic Emission of Integrated Circuits under Electromagnetic Interference. in 2023 19th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD)., 10192236, ACM/IEEE, 2023 19th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design, Funchal, Portugal, 3/07/23. https://doi.org/10.1109/SMACD58065.2023.10192236

@inproceedings{0ba290d9d61c4ef4b0e962248c29dbd4,

title = "Framework to Simulate and Analyse the Electromagnetic Emission of Integrated Circuits under Electromagnetic Interference",

abstract = "Ensuring the safe operation of electronic systems requires them to comply with electromagnetic compatibility (EMC) regulations. We can achieve this by conducting various EMC tests, including checking electromagnetic emission limits and immunity to interference signals, both on integrated circuit (IC) and on system level. However, these tests are typically performed separately, without considering the potential impact of one test on another. In this paper we present a framework to address this issue by simulation and subsequent post-processing. We focus on the impact of radio frequency (RF) disturbances on the electromagnetic emission of an IC, and propose a framework based on LTspice and Python, that implements the direct power injection (DPI) characterisation method and the 150 Ohm method. Within this paper we demonstrate the usability of this framework and how the resulting plot can support circuit designers in developing EMC compliant circuits. To do so, we utilise a test circuit, where the electromagnetic emission is significantly altered by an RF disturbance.",

keywords = "Radio frequency, Immunity testing, Electromagnetic compatibility, Regulation, Electromagnetics, Integrated circuit modeling, IEC Standards, Combined EMC testing, Direct Power Injection (DPI), Electromagnetic Compatibility (EMC), Electromagnetic Interference (EMI), IEC 61967, IEC 62132, Radio Frequency Interference (RFI), Simulation Framework",

author = "Dominik Zupan and Daniel Kircher and Nikolaus Czepl and Bernd Deutschmann",

year = "2023",

month = jul,

day = "5",

doi = "10.1109/SMACD58065.2023.10192236",

language = "English",

isbn = "979-8-3503-3284-1",

booktitle = "2023 19th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD)",

publisher = "ACM/IEEE",

note = "2023 19th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design : SMACD 2023, SMACD 2023 ; Conference date: 03-07-2023 Through 05-07-2023",

}

TY - GEN

T1 - Framework to Simulate and Analyse the Electromagnetic Emission of Integrated Circuits under Electromagnetic Interference

AU - Zupan, Dominik

AU - Kircher, Daniel

AU - Czepl, Nikolaus

AU - Deutschmann, Bernd

PY - 2023/7/5

Y1 - 2023/7/5

N2 - Ensuring the safe operation of electronic systems requires them to comply with electromagnetic compatibility (EMC) regulations. We can achieve this by conducting various EMC tests, including checking electromagnetic emission limits and immunity to interference signals, both on integrated circuit (IC) and on system level. However, these tests are typically performed separately, without considering the potential impact of one test on another. In this paper we present a framework to address this issue by simulation and subsequent post-processing. We focus on the impact of radio frequency (RF) disturbances on the electromagnetic emission of an IC, and propose a framework based on LTspice and Python, that implements the direct power injection (DPI) characterisation method and the 150 Ohm method. Within this paper we demonstrate the usability of this framework and how the resulting plot can support circuit designers in developing EMC compliant circuits. To do so, we utilise a test circuit, where the electromagnetic emission is significantly altered by an RF disturbance.

AB - Ensuring the safe operation of electronic systems requires them to comply with electromagnetic compatibility (EMC) regulations. We can achieve this by conducting various EMC tests, including checking electromagnetic emission limits and immunity to interference signals, both on integrated circuit (IC) and on system level. However, these tests are typically performed separately, without considering the potential impact of one test on another. In this paper we present a framework to address this issue by simulation and subsequent post-processing. We focus on the impact of radio frequency (RF) disturbances on the electromagnetic emission of an IC, and propose a framework based on LTspice and Python, that implements the direct power injection (DPI) characterisation method and the 150 Ohm method. Within this paper we demonstrate the usability of this framework and how the resulting plot can support circuit designers in developing EMC compliant circuits. To do so, we utilise a test circuit, where the electromagnetic emission is significantly altered by an RF disturbance.

KW - Radio frequency

KW - Immunity testing

KW - Electromagnetic compatibility

KW - Regulation

KW - Electromagnetics

KW - Integrated circuit modeling

KW - IEC Standards

KW - Combined EMC testing

KW - Direct Power Injection (DPI)

KW - Electromagnetic Compatibility (EMC)

KW - Electromagnetic Interference (EMI)

KW - IEC 61967

KW - IEC 62132

KW - Radio Frequency Interference (RFI)

KW - Simulation Framework

UR - http://www.scopus.com/inward/record.url?scp=85168693971&partnerID=8YFLogxK

U2 - 10.1109/SMACD58065.2023.10192236

DO - 10.1109/SMACD58065.2023.10192236

M3 - Conference paper

SN - 979-8-3503-3284-1

BT - 2023 19th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD)

PB - ACM/IEEE

T2 - 2023 19th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design

Y2 - 3 July 2023 through 5 July 2023

ER -

Framework to Simulate and Analyse the Electromagnetic Emission of Integrated Circuits under Electromagnetic Interference

Abstract

Conference

Keywords

ASJC Scopus subject areas

Access to Document

Other files and links

Fingerprint

2023 19th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design

Cite this

Framework to Simulate and Analyse the Electromagnetic Emission of Integrated Circuits under Electromagnetic Interference

Abstract

Conference

Keywords

ASJC Scopus subject areas

Access to Document

Other files and links

Fingerprint

Activities

2023 19th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design

Cite this