Frequency-domain measurement method for the analysis of ESD generators and coupling

Jayong Koo*, Qing Cai, Giorgi Muchaidze, Andy Martwick, Kai Wang, David Pommerenke

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review


A method for analyzing electrostatic discharge (ESD) generators and coupling to equipment under test in the frequency domain is proposed. In ESD generators, the pulses are excited by the voltage collapse across relay contacts. The voltage collapse is replaced by one port of a vector network analyer (VNA). All the discrete and structural elements that form the ESD current pulse and the transient fields are excited by the VNA as if they were excited by the voltage collapse. In such a way, the method allows analyzing the current and field-driven linear coupling without having to discharge an ESD generator, eliminating the risk to the circuit and allowing the use of the wider dynamic range of a network analyzer relative to a real-time oscilloscope. The method is applicable to other voltage-collapse-driven tests, such as electrical fast transient, ultrawideband susceptibility testing but requires a linear coupling path.

Original languageEnglish
Pages (from-to)504-511
Number of pages8
JournalIEEE Transactions on Electromagnetic Compatibility
Issue number3
Publication statusPublished - 1 Dec 2007
Externally publishedYes


  • Electrostatic discharge (ESD)
  • Network analyzer (NWA)
  • Simulation

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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