Full X-ray pattern analysis of vacuum deposited pentacene thin films

Oliver Werzer, B. Stadlober, A. Haase, M. Oehzelt, Roland Resel

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	455-459
Journal	The European Physical Journal B
Volume	66
Issue number	4
DOIs	https://doi.org/10.1140/epjb/e2008-00452-x
Publication status	Published - 2008

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@article{947431d6f2f34f7bb3af76845ea1fc29,

title = "Full X-ray pattern analysis of vacuum deposited pentacene thin films",

author = "Oliver Werzer and B. Stadlober and A. Haase and M. Oehzelt and Roland Resel",

year = "2008",

doi = "10.1140/epjb/e2008-00452-x",

language = "English",

volume = "66",

pages = "455--459",

journal = "The European Physical Journal B",

issn = "1434-6036",

publisher = "EDP Sciences",

number = "4",

}

TY - JOUR

T1 - Full X-ray pattern analysis of vacuum deposited pentacene thin films

AU - Werzer, Oliver

AU - Stadlober, B.

AU - Haase, A.

AU - Oehzelt, M.

AU - Resel, Roland

PY - 2008

Y1 - 2008

U2 - 10.1140/epjb/e2008-00452-x

DO - 10.1140/epjb/e2008-00452-x

M3 - Article

SN - 1434-6036

VL - 66

SP - 455

EP - 459

JO - The European Physical Journal B

JF - The European Physical Journal B

IS - 4

ER -