Abstract
Electromagnetic compatibility (EMC) analysis of complex electronic devices is a time-consuming task in the industry. Physically motivated resistive, inductive, and capacitive (RLC) models greatly expedite the analysis. But up to date methods available to extract them from 3-D simulation models generate RLC models which contain too many elements to be easily interpreted. In this article, we combine a method for RLC extraction which is known to generate comparably small equivalent electrical circuits with an adjoint sensitivity analysis for further reduction. The resulting circuit explicitly contains only functional and relevant parasitic elements. We demonstrate that EMC analysis and subsequent optimization becomes feasible by applying the method to two hardware samples provided by the Robert Bosch GmbH.
Original language | English |
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Article number | 3321078 |
Pages (from-to) | 1811-1819 |
Number of pages | 9 |
Journal | IEEE Transactions on Electromagnetic Compatibility |
Volume | 65 |
Issue number | 6 |
DOIs | |
Publication status | Published - 1 Dec 2023 |
Keywords
- electrical drive
- Equivalent electrical circuits (EEC)
- parasitic extraction
- sensitivity analysis
- sensor immunity
ASJC Scopus subject areas
- Atomic and Molecular Physics, and Optics
- Condensed Matter Physics
- Electrical and Electronic Engineering