Grazing-incidence in-plane X-ray diffraction on ultra-thin organic films using standard laboratory equipment

Markus Neuschitzer, Armin Moser, Alfred Neuhold, Johanna Kraxner, Barbara Stadlober, Martin Oehzelt, Ingo Salzmann, Roland Resel, Jiri Novak

Research output: Contribution to journalArticlepeer-review

Original languageGerman
Pages (from-to)1-4
JournalJournal of Applied Crystallography
Publication statusPublished - 2012

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)
  • Application
  • Experimental

Cite this