High level fault injection for attack simulation in smart cards

Klaus Rothbart, Ulrich Neffe, Christian Steger, Reinhold Weiß, Edgar Rieger, Andreas Mühlberger

Research output: Chapter in Book/Report/Conference proceeding › Conference paper › peer-review

Original language	English
Title of host publication	Proceedings / 13th Asian Test Symposium
Place of Publication	Los Alamitos, Calif.
Publisher	.
Pages	118-121
ISBN (Print)	0-7695-2235-1
Publication status	Published - 2004
Event	Asian Test Symposium - Kenting, Taiwan, Province of China Duration: 15 Nov 2004 → 17 Nov 2004

Hardware/Software-Codesign
Steger, C., Seifert, C., Stelzer, P., Feldbacher, M., Fiala, G. & Basic, F.
1/01/95 → …
Project: Research area

Cite this

@inproceedings{051df264d5f64fceaa30152fc2cb7980,

title = "High level fault injection for attack simulation in smart cards",

author = "Klaus Rothbart and Ulrich Neffe and Christian Steger and Reinhold Wei{\ss} and Edgar Rieger and Andreas M{\"u}hlberger",

year = "2004",

language = "English",

isbn = "0-7695-2235-1",

pages = "118--121",

booktitle = "Proceedings / 13th Asian Test Symposium",

publisher = ".",

note = "Asian Test Symposium ; Conference date: 15-11-2004 Through 17-11-2004",

}

TY - GEN

T1 - High level fault injection for attack simulation in smart cards

AU - Rothbart, Klaus

AU - Neffe, Ulrich

AU - Steger, Christian

AU - Weiß, Reinhold

AU - Rieger, Edgar

AU - Mühlberger, Andreas

PY - 2004

Y1 - 2004

M3 - Conference paper

SN - 0-7695-2235-1

SP - 118

EP - 121

BT - Proceedings / 13th Asian Test Symposium

PB - .

CY - Los Alamitos, Calif.

T2 - Asian Test Symposium

Y2 - 15 November 2004 through 17 November 2004

ER -