Abstract
The design and realization of capacitive measurement systems requires a variety of prior knowledge of the system, to achieve the intended performance. Electrical capacitance tomography (ECT) is a high end application of capacitive sensing.The required electronics is usually tailored to specific application constraints. To compare suitable circuit structures, a holistic design framework is required considering all components and their mutual interactions to derive appropriate figures of merit. We present an analysis framework and exemplary compare two different ECT circuit structures with respect to their sensitivity. The framework incorporates real world sensor conditions, for the application of the system.
| Translated title of the contribution | Holistic analysis for electrical capacitance tomography front-end electronics |
|---|---|
| Original language | English |
| Article number | 092008 |
| Number of pages | 4 |
| Journal | Journal of Physics: Conference Series |
| Volume | 1065 |
| DOIs | |
| Publication status | Published - 2018 |
| Event | XXII World Congress of the International Measurement Confederation - Belfast Waterfront, Belfast, United Kingdom Duration: 3 Sept 2018 → 6 Sept 2018 Conference number: 22 http://www.imeko2018.org/ |