IEC 61000-4-2 ESD Test in Display Down Configuration for Cell Phones

Jianchi Zhou; Satyajeet Shinde; Yuandong Guo; Atieh Talebzadeh; Shubhankar Marathe; Yingjie Gan; Ki Hyuk Kim; David Pommerenke

doi:10.1109/ISEMC.2016.7571736

IEC 61000-4-2 ESD Test in Display Down Configuration for Cell Phones

Jianchi Zhou, Satyajeet Shinde, Yuandong Guo, Atieh Talebzadeh, Shubhankar Marathe, Yingjie Gan, Ki Hyuk Kim, David Pommerenke

Research output: Chapter in Book/Report/Conference proceeding › Conference paper › peer-review

Abstract

During the IEC 61000-4-2 test the DUT is placed on a 0.5 mm insulating sheet, which is on the horizontal coupling plane (HCP). For discharge points on the back side of the phone this leads to a situation in which the display is facing the HCP. The phone or tablet forms a capacitance between 50 pF and 300 pF to the HCP. The capacitance value depends on the size of the phone, its screen flatness, and the flatness of the insulator which may deteriorate over time. The discharges to the phone lead to a large displacement current flowing through the display. This current has multiple paths to the body of the phone: via the touch electronics, via the display electronics, and directly to the body of the phone. As these currents can reach 30 A (at 8 kV contact mode) they can lead to upset and damage of both the display and the touch layers. This paper provides analysis of the display down test situation in order to show reproducibility problems. The effect of the capacitance variation is shown by the measurement and the PSPICE model. Full-wave model was used to help understand how much of the total current flows through the body of the phone. The Lichtenberg dust figure method was used to show the contribution of the corona discharge

Original language	English
Title of host publication	2016 IEEE International Symposium on Electromagnetic Compatibility (EMC)
Publisher	Institute of Electrical and Electronics Engineers
Pages	713-718
Number of pages	6
ISBN (Electronic)	9781509014415
DOIs	https://doi.org/10.1109/ISEMC.2016.7571736
Publication status	Published - 1 Jan 2016
Externally published	Yes
Event	2016 IEEE International Symposium on Electromagnetic Compatibility: EMC 2016 - Ottawa, Canada Duration: 25 Jul 2016 → 29 Jul 2016

Conference

Conference	2016 IEEE International Symposium on Electromagnetic Compatibility
Country/Territory	Canada
City	Ottawa
Period	25/07/16 → 29/07/16

Keywords

display
Electrostatic discharge
IEC 61000-4-2
mobile phone

ASJC Scopus subject areas

Condensed Matter Physics
Electrical and Electronic Engineering

Access to Document

10.1109/ISEMC.2016.7571736

Cite this

Zhou, J., Shinde, S., Guo, Y., Talebzadeh, A., Marathe, S., Gan, Y., Kim, K. H., & Pommerenke, D. (2016). IEC 61000-4-2 ESD Test in Display Down Configuration for Cell Phones. In 2016 IEEE International Symposium on Electromagnetic Compatibility (EMC) (pp. 713-718). [7571736] Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/ISEMC.2016.7571736

IEC 61000-4-2 ESD Test in Display Down Configuration for Cell Phones. / Zhou, Jianchi; Shinde, Satyajeet; Guo, Yuandong et al.
2016 IEEE International Symposium on Electromagnetic Compatibility (EMC). Institute of Electrical and Electronics Engineers, 2016. p. 713-718 7571736.

Research output: Chapter in Book/Report/Conference proceeding › Conference paper › peer-review

Zhou, J, Shinde, S, Guo, Y, Talebzadeh, A, Marathe, S, Gan, Y, Kim, KH & Pommerenke, D 2016, IEC 61000-4-2 ESD Test in Display Down Configuration for Cell Phones. in 2016 IEEE International Symposium on Electromagnetic Compatibility (EMC)., 7571736, Institute of Electrical and Electronics Engineers, pp. 713-718, 2016 IEEE International Symposium on Electromagnetic Compatibility, Ottawa, Canada, 25/07/16. https://doi.org/10.1109/ISEMC.2016.7571736

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abstract = "During the IEC 61000-4-2 test the DUT is placed on a 0.5 mm insulating sheet, which is on the horizontal coupling plane (HCP). For discharge points on the back side of the phone this leads to a situation in which the display is facing the HCP. The phone or tablet forms a capacitance between 50 pF and 300 pF to the HCP. The capacitance value depends on the size of the phone, its screen flatness, and the flatness of the insulator which may deteriorate over time. The discharges to the phone lead to a large displacement current flowing through the display. This current has multiple paths to the body of the phone: via the touch electronics, via the display electronics, and directly to the body of the phone. As these currents can reach 30 A (at 8 kV contact mode) they can lead to upset and damage of both the display and the touch layers. This paper provides analysis of the display down test situation in order to show reproducibility problems. The effect of the capacitance variation is shown by the measurement and the PSPICE model. Full-wave model was used to help understand how much of the total current flows through the body of the phone. The Lichtenberg dust figure method was used to show the contribution of the corona discharge",

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N2 - During the IEC 61000-4-2 test the DUT is placed on a 0.5 mm insulating sheet, which is on the horizontal coupling plane (HCP). For discharge points on the back side of the phone this leads to a situation in which the display is facing the HCP. The phone or tablet forms a capacitance between 50 pF and 300 pF to the HCP. The capacitance value depends on the size of the phone, its screen flatness, and the flatness of the insulator which may deteriorate over time. The discharges to the phone lead to a large displacement current flowing through the display. This current has multiple paths to the body of the phone: via the touch electronics, via the display electronics, and directly to the body of the phone. As these currents can reach 30 A (at 8 kV contact mode) they can lead to upset and damage of both the display and the touch layers. This paper provides analysis of the display down test situation in order to show reproducibility problems. The effect of the capacitance variation is shown by the measurement and the PSPICE model. Full-wave model was used to help understand how much of the total current flows through the body of the phone. The Lichtenberg dust figure method was used to show the contribution of the corona discharge

AB - During the IEC 61000-4-2 test the DUT is placed on a 0.5 mm insulating sheet, which is on the horizontal coupling plane (HCP). For discharge points on the back side of the phone this leads to a situation in which the display is facing the HCP. The phone or tablet forms a capacitance between 50 pF and 300 pF to the HCP. The capacitance value depends on the size of the phone, its screen flatness, and the flatness of the insulator which may deteriorate over time. The discharges to the phone lead to a large displacement current flowing through the display. This current has multiple paths to the body of the phone: via the touch electronics, via the display electronics, and directly to the body of the phone. As these currents can reach 30 A (at 8 kV contact mode) they can lead to upset and damage of both the display and the touch layers. This paper provides analysis of the display down test situation in order to show reproducibility problems. The effect of the capacitance variation is shown by the measurement and the PSPICE model. Full-wave model was used to help understand how much of the total current flows through the body of the phone. The Lichtenberg dust figure method was used to show the contribution of the corona discharge

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IEC 61000-4-2 ESD Test in Display Down Configuration for Cell Phones

Abstract

Conference

Keywords

ASJC Scopus subject areas

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Cite this