Imaging atom probe characterization of STM tips

Alexander Fian, Manfred Leisch

Research output: Chapter in Book/Report/Conference proceedingConference paperpeer-review

Original languageEnglish
Title of host publicationEurophysics conference abstracts ; 24 C
Place of PublicationParis
PublisherEuropean Physical Society
Pages155-155
Publication statusPublished - 2000
EventEuropean Conference on Surface Science - Madrid, Spain
Duration: 5 Sept 20008 Sept 2000

Conference

ConferenceEuropean Conference on Surface Science
Country/TerritorySpain
CityMadrid
Period5/09/008/09/00

Treatment code (Nähere Zuordnung)

  • Experimental

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