Original language | English |
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Title of host publication | What Where When Multi-dimensional Advances for Industrial Process Monitoring |
Publisher | . |
Pages | 129-138 |
Publication status | Published - 2009 |
Impact of Leakage Effects in Electrical Capacitance Tomography due to Short Electrode Length
Hubert Zangl, Markus Neumayer
Research output: Chapter in Book/Report/Conference proceeding › Conference paper › peer-review