@article{88a1d69f67b7426c8b390a7436b17b9c,
title = "In-situ Correlative Analysis of Electrical and Mechanical Properties of 3D Nanostructures by Combination of AFM, SEM and FIB",
author = "C. Schwalb and Pinar Frank and Stefan Hummel and J{\"u}rgen Sattelkow and Robert Winkler and Johanna H{\"u}tner and G.E. Fantner and Harald Plank",
year = "2020",
month = jul,
day = "30",
doi = "10.1017/S1431927620019388",
language = "English",
volume = "26",
pages = "1800--1801",
journal = "Microscopy and Microanalysis",
issn = "1431-9276",
publisher = "Cambridge University Press",
number = "S2",
}