In-situ XRD and FIB microscopy studies of the dynamics of intermetallic phase formation in thin layer Cu/Sn films for low-temperature isothermal diffusion soldering

Peter Hadley

doi:10.1557/opl.2011.268

In-situ XRD and FIB microscopy studies of the dynamics of intermetallic phase formation in thin layer Cu/Sn films for low-temperature isothermal diffusion soldering

Institute of Solid State Physics (5130)

Research output: Chapter in Book/Report/Conference proceeding › Conference paper › peer-review

Original language	English
Title of host publication	MRS Proceedings
Publisher	.
Pages	mrs10-131-0
DOIs	https://doi.org/10.1557/opl.2011.268
Publication status	Published - 2011

Fields of Expertise

Advanced Materials Science

Treatment code (Nähere Zuordnung)

Experimental

Access to Document

10.1557/opl.2011.268

Cite this

@inproceedings{70e971cf37c24bfd9e4dab197ad959ca,

title = "In-situ XRD and FIB microscopy studies of the dynamics of intermetallic phase formation in thin layer Cu/Sn films for low-temperature isothermal diffusion soldering",

author = "Peter Hadley",

year = "2011",

doi = "10.1557/opl.2011.268",

language = "English",

pages = "mrs10--131--0",

booktitle = "MRS Proceedings",

publisher = ".",

}