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NILsimtos - Device simulation and temperature dependent measurements of critical OTFT parameters for the optimisation of the semiconductor growth in NIL-processed active devices
Marchl, M. (Co-Investigator (CoI)), Zojer, K. (Principal Investigator (PI)), Zojer, E. (Principal Investigator (PI)), Gruber, M. (Co-Investigator (CoI)) & Schürrer, F. (Principal Investigator (PI))
1/04/08 → 31/03/11
Project: Research project