Investigation of the ESD induced clock disturbances in portable electronic products

Viswa Pilla; Pratik Maheshwari; Tianqi Li; David J. Pommerenke; Junji Maeshima; Hideki Shumiya; Takashi Yamada; Kenji Araki

doi:10.1109/ISEMC.2013.6670435

Investigation of the ESD induced clock disturbances in portable electronic products

Viswa Pilla, Pratik Maheshwari, Tianqi Li, David J. Pommerenke, Junji Maeshima, Hideki Shumiya, Takashi Yamada, Kenji Araki

Research output: Chapter in Book/Report/Conference proceeding › Conference paper › peer-review

Abstract

ESD events can induce noise on the system clock which may lead to soft-errors in the portable electronic products. This paper presents measurement techniques to investigate the ESD induced clock disturbances. At first, the soft-errors due to system level ESD testing on a DUT are shown. Next, local field scanning and direct injection are performed to identify ESD sensitive areas/traces. Techniques for soft-error threshold measurement using synchronized noise injection techniques are shown. Short time FFT (STFFT) based spectrogram method to investigate the PLL output frequency deviation due to the clock line noise, is presented.

Original language	English
Title of host publication	Proceedings - 2013 IEEE International Symposium on Electromagnetic Compatibility, EMC 2013
Pages	343-347
Number of pages	5
DOIs	https://doi.org/10.1109/ISEMC.2013.6670435
Publication status	Published - 1 Dec 2013
Externally published	Yes
Event	2013 IEEE International Symposium on Electromagnetic Compatibility: EMC 2013 - Denver, United States Duration: 5 Aug 2013 → 9 Aug 2013

Publication series

Name	IEEE International Symposium on Electromagnetic Compatibility
ISSN (Print)	1077-4076
ISSN (Electronic)	2158-1118

Conference

Conference	2013 IEEE International Symposium on Electromagnetic Compatibility
Country/Territory	United States
City	Denver
Period	5/08/13 → 9/08/13

ASJC Scopus subject areas

Condensed Matter Physics
Electrical and Electronic Engineering

Access to Document

10.1109/ISEMC.2013.6670435

Cite this

Pilla, V., Maheshwari, P., Li, T., Pommerenke, D. J., Maeshima, J., Shumiya, H., Yamada, T., & Araki, K. (2013). Investigation of the ESD induced clock disturbances in portable electronic products. In Proceedings - 2013 IEEE International Symposium on Electromagnetic Compatibility, EMC 2013 (pp. 343-347). [6670435] (IEEE International Symposium on Electromagnetic Compatibility). https://doi.org/10.1109/ISEMC.2013.6670435

Investigation of the ESD induced clock disturbances in portable electronic products. / Pilla, Viswa; Maheshwari, Pratik; Li, Tianqi et al.
Proceedings - 2013 IEEE International Symposium on Electromagnetic Compatibility, EMC 2013. 2013. p. 343-347 6670435 (IEEE International Symposium on Electromagnetic Compatibility).

Research output: Chapter in Book/Report/Conference proceeding › Conference paper › peer-review

Pilla, V, Maheshwari, P, Li, T, Pommerenke, DJ, Maeshima, J, Shumiya, H, Yamada, T & Araki, K 2013, Investigation of the ESD induced clock disturbances in portable electronic products. in Proceedings - 2013 IEEE International Symposium on Electromagnetic Compatibility, EMC 2013., 6670435, IEEE International Symposium on Electromagnetic Compatibility, pp. 343-347, 2013 IEEE International Symposium on Electromagnetic Compatibility, Denver, Colorado, United States, 5/08/13. https://doi.org/10.1109/ISEMC.2013.6670435

Pilla V, Maheshwari P, Li T, Pommerenke DJ, Maeshima J, Shumiya H et al. Investigation of the ESD induced clock disturbances in portable electronic products. In Proceedings - 2013 IEEE International Symposium on Electromagnetic Compatibility, EMC 2013. 2013. p. 343-347. 6670435. (IEEE International Symposium on Electromagnetic Compatibility). doi: 10.1109/ISEMC.2013.6670435

@inproceedings{36b87133d4754e59b6b12d4f55a8131b,

title = "Investigation of the ESD induced clock disturbances in portable electronic products",

abstract = "ESD events can induce noise on the system clock which may lead to soft-errors in the portable electronic products. This paper presents measurement techniques to investigate the ESD induced clock disturbances. At first, the soft-errors due to system level ESD testing on a DUT are shown. Next, local field scanning and direct injection are performed to identify ESD sensitive areas/traces. Techniques for soft-error threshold measurement using synchronized noise injection techniques are shown. Short time FFT (STFFT) based spectrogram method to investigate the PLL output frequency deviation due to the clock line noise, is presented.",

author = "Viswa Pilla and Pratik Maheshwari and Tianqi Li and Pommerenke, {David J.} and Junji Maeshima and Hideki Shumiya and Takashi Yamada and Kenji Araki",

year = "2013",

month = dec,

day = "1",

doi = "10.1109/ISEMC.2013.6670435",

language = "English",

isbn = "9781479904082",

series = "IEEE International Symposium on Electromagnetic Compatibility",

pages = "343--347",

booktitle = "Proceedings - 2013 IEEE International Symposium on Electromagnetic Compatibility, EMC 2013",

note = "2013 IEEE International Symposium on Electromagnetic Compatibility : EMC 2013 ; Conference date: 05-08-2013 Through 09-08-2013",

}

TY - GEN

T1 - Investigation of the ESD induced clock disturbances in portable electronic products

AU - Pilla, Viswa

AU - Maheshwari, Pratik

AU - Li, Tianqi

AU - Pommerenke, David J.

AU - Maeshima, Junji

AU - Shumiya, Hideki

AU - Yamada, Takashi

AU - Araki, Kenji

PY - 2013/12/1

Y1 - 2013/12/1

N2 - ESD events can induce noise on the system clock which may lead to soft-errors in the portable electronic products. This paper presents measurement techniques to investigate the ESD induced clock disturbances. At first, the soft-errors due to system level ESD testing on a DUT are shown. Next, local field scanning and direct injection are performed to identify ESD sensitive areas/traces. Techniques for soft-error threshold measurement using synchronized noise injection techniques are shown. Short time FFT (STFFT) based spectrogram method to investigate the PLL output frequency deviation due to the clock line noise, is presented.

AB - ESD events can induce noise on the system clock which may lead to soft-errors in the portable electronic products. This paper presents measurement techniques to investigate the ESD induced clock disturbances. At first, the soft-errors due to system level ESD testing on a DUT are shown. Next, local field scanning and direct injection are performed to identify ESD sensitive areas/traces. Techniques for soft-error threshold measurement using synchronized noise injection techniques are shown. Short time FFT (STFFT) based spectrogram method to investigate the PLL output frequency deviation due to the clock line noise, is presented.

UR - http://www.scopus.com/inward/record.url?scp=84893157164&partnerID=8YFLogxK

U2 - 10.1109/ISEMC.2013.6670435

DO - 10.1109/ISEMC.2013.6670435

M3 - Conference paper

AN - SCOPUS:84893157164

SN - 9781479904082

T3 - IEEE International Symposium on Electromagnetic Compatibility

SP - 343

EP - 347

BT - Proceedings - 2013 IEEE International Symposium on Electromagnetic Compatibility, EMC 2013

T2 - 2013 IEEE International Symposium on Electromagnetic Compatibility

Y2 - 5 August 2013 through 9 August 2013

ER -

Investigation of the ESD induced clock disturbances in portable electronic products

Abstract

Publication series

Conference

ASJC Scopus subject areas

Access to Document

Other files and links

Cite this