Laser optical in-circuit measurement system for immunity applications

Chong Ding; David Pommerenke

doi:10.1109/ISEMC.2006.1706373.

Laser optical in-circuit measurement system for immunity applications

Chong Ding^*, David Pommerenke

^*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceeding › Conference paper › peer-review

Abstract

During immunity testing (ESD, EFT) of a digital circuit, the waveforms of critical signal nets need to be measured for analyzing the failure mechanism. However, it is difficult to measure the induced voltage in the circuit under test due to the unwanted coupling by the non-ideal shielding of the probe cable, especially, if large common mode currents are present. Fiber optical connection avoids this problem. Semiconductor lasers have frequently been used for converting the voltage into an optical signal. The paper shows novel implementations of powering the laser, leading to a small, low cost optical probe.

Original language	English
Title of host publication	2006 IEEE International Symposium on Electromagnetic Compatibility, EMC 2006
Pages	569-574
Number of pages	6
DOIs	https://doi.org/10.1109/ISEMC.2006.1706373.
Publication status	Published - 1 Dec 2006
Externally published	Yes
Event	2006 IEEE International Symposium on Electromagnetic Compatibility: EMC 2006 - Portland, United States Duration: 14 Aug 2006 → 18 Aug 2006

Conference

Conference	2006 IEEE International Symposium on Electromagnetic Compatibility
Country/Territory	United States
City	Portland
Period	14/08/06 → 18/08/06

Keywords

EM coupling
Non-ideal shielding
Optical link
Susceptibility test

ASJC Scopus subject areas

Condensed Matter Physics
Electrical and Electronic Engineering

Access to Document

10.1109/ISEMC.2006.1706373.

Cite this

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title = "Laser optical in-circuit measurement system for immunity applications",

abstract = "During immunity testing (ESD, EFT) of a digital circuit, the waveforms of critical signal nets need to be measured for analyzing the failure mechanism. However, it is difficult to measure the induced voltage in the circuit under test due to the unwanted coupling by the non-ideal shielding of the probe cable, especially, if large common mode currents are present. Fiber optical connection avoids this problem. Semiconductor lasers have frequently been used for converting the voltage into an optical signal. The paper shows novel implementations of powering the laser, leading to a small, low cost optical probe.",

keywords = "EM coupling, Non-ideal shielding, Optical link, Susceptibility test",

author = "Chong Ding and David Pommerenke",

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doi = "10.1109/ISEMC.2006.1706373.",

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AU - Ding, Chong

AU - Pommerenke, David

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N2 - During immunity testing (ESD, EFT) of a digital circuit, the waveforms of critical signal nets need to be measured for analyzing the failure mechanism. However, it is difficult to measure the induced voltage in the circuit under test due to the unwanted coupling by the non-ideal shielding of the probe cable, especially, if large common mode currents are present. Fiber optical connection avoids this problem. Semiconductor lasers have frequently been used for converting the voltage into an optical signal. The paper shows novel implementations of powering the laser, leading to a small, low cost optical probe.

AB - During immunity testing (ESD, EFT) of a digital circuit, the waveforms of critical signal nets need to be measured for analyzing the failure mechanism. However, it is difficult to measure the induced voltage in the circuit under test due to the unwanted coupling by the non-ideal shielding of the probe cable, especially, if large common mode currents are present. Fiber optical connection avoids this problem. Semiconductor lasers have frequently been used for converting the voltage into an optical signal. The paper shows novel implementations of powering the laser, leading to a small, low cost optical probe.

KW - EM coupling

KW - Non-ideal shielding

KW - Optical link

KW - Susceptibility test

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M3 - Conference paper

AN - SCOPUS:34047204090

SN - 142440293X

SN - 9781424402939

SP - 569

EP - 574

BT - 2006 IEEE International Symposium on Electromagnetic Compatibility, EMC 2006

T2 - 2006 IEEE International Symposium on Electromagnetic Compatibility

Y2 - 14 August 2006 through 18 August 2006

ER -

Laser optical in-circuit measurement system for immunity applications

Abstract

Conference

Keywords

ASJC Scopus subject areas

Access to Document

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Cite this