Low-return Loss Design of PCB Probe-to-Microstrip Transition for Frequencies up to 150 GHz

Ziad Hatab; Ahmad  Alterkawi; Hiroaki Takahashi; Michael Ernst Gadringer; Wolfgang Bösch

doi:10.23919/APMC55665.2022.9999913

Low-return Loss Design of PCB Probe-to-Microstrip Transition for Frequencies up to 150 GHz

Ziad Hatab, Ahmad Alterkawi, Hiroaki Takahashi, Michael Ernst Gadringer, Wolfgang Bösch

Institute of Microwave and Photonic Engineering (4510)

Research output: Chapter in Book/Report/Conference proceeding › Conference paper › peer-review

Abstract

For the measurement of devices mounted on printed circuit boards (PCBs), suitable interfaces are required. Conventional PCB coaxial connectors require a significant handling time to be fixed on a PCB. In addition, they cannot be used for automated testing of multiple devices. On-wafer probing solutions offer superior performance and are easy to automate. This paper presents a methodological approach for designing low-return loss PCB coplanar-to-microstrip transition pads that can be probed with commercial on-wafer probing solutions. We show measurements demonstrating a return loss of better than 15 dB up to 150 GHz. These results agree with electromagnetic (EM) simulation.

Original language	English
Title of host publication	2022 Asia-Pacific Microwave Conference (APMC)
Publisher	Institute of Electrical and Electronics Engineers
Pages	208 - 210
ISBN (Electronic)	978-4-902339-56-7
DOIs	https://doi.org/10.23919/APMC55665.2022.9999913
Publication status	Published - 30 Nov 2022
Event	Asian Pacific Microwave Conference 2022: APMC 2022 - Pacifico YOKOHAMA, Yokohama, Japan Duration: 29 Nov 2022 → 2 Dec 2022 https://apmc2022.org/

Conference

Conference	Asian Pacific Microwave Conference 2022
Abbreviated title	APMC 2022
Country/Territory	Japan
City	Yokohama
Period	29/11/22 → 2/12/22
Internet address	https://apmc2022.org/

ASJC Scopus subject areas

Instrumentation
Electrical and Electronic Engineering
Signal Processing

Fields of Expertise

Information, Communication & Computing

Treatment code (Nähere Zuordnung)

Experimental

Access to Document

10.23919/APMC55665.2022.9999913Licence: Other

Cite this

Hatab, Z, Alterkawi, A, Takahashi, H, Gadringer, ME & Bösch, W 2022, Low-return Loss Design of PCB Probe-to-Microstrip Transition for Frequencies up to 150 GHz. in 2022 Asia-Pacific Microwave Conference (APMC). Institute of Electrical and Electronics Engineers, pp. 208 - 210, Asian Pacific Microwave Conference 2022, Yokohama, Japan, 29/11/22. https://doi.org/10.23919/APMC55665.2022.9999913

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title = "Low-return Loss Design of PCB Probe-to-Microstrip Transition for Frequencies up to 150 GHz",

abstract = "For the measurement of devices mounted on printed circuit boards (PCBs), suitable interfaces are required. Conventional PCB coaxial connectors require a significant handling time to be fixed on a PCB. In addition, they cannot be used for automated testing of multiple devices. On-wafer probing solutions offer superior performance and are easy to automate. This paper presents a methodological approach for designing low-return loss PCB coplanar-to-microstrip transition pads that can be probed with commercial on-wafer probing solutions. We show measurements demonstrating a return loss of better than 15 dB up to 150 GHz. These results agree with electromagnetic (EM) simulation.",

author = "Ziad Hatab and Ahmad Alterkawi and Hiroaki Takahashi and Gadringer, {Michael Ernst} and Wolfgang B{\"o}sch",

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doi = "10.23919/APMC55665.2022.9999913",

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booktitle = "2022 Asia-Pacific Microwave Conference (APMC)",

publisher = "Institute of Electrical and Electronics Engineers",

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T1 - Low-return Loss Design of PCB Probe-to-Microstrip Transition for Frequencies up to 150 GHz

AU - Hatab, Ziad

AU - Alterkawi, Ahmad

AU - Takahashi, Hiroaki

AU - Gadringer, Michael Ernst

AU - Bösch, Wolfgang

PY - 2022/11/30

Y1 - 2022/11/30

N2 - For the measurement of devices mounted on printed circuit boards (PCBs), suitable interfaces are required. Conventional PCB coaxial connectors require a significant handling time to be fixed on a PCB. In addition, they cannot be used for automated testing of multiple devices. On-wafer probing solutions offer superior performance and are easy to automate. This paper presents a methodological approach for designing low-return loss PCB coplanar-to-microstrip transition pads that can be probed with commercial on-wafer probing solutions. We show measurements demonstrating a return loss of better than 15 dB up to 150 GHz. These results agree with electromagnetic (EM) simulation.

AB - For the measurement of devices mounted on printed circuit boards (PCBs), suitable interfaces are required. Conventional PCB coaxial connectors require a significant handling time to be fixed on a PCB. In addition, they cannot be used for automated testing of multiple devices. On-wafer probing solutions offer superior performance and are easy to automate. This paper presents a methodological approach for designing low-return loss PCB coplanar-to-microstrip transition pads that can be probed with commercial on-wafer probing solutions. We show measurements demonstrating a return loss of better than 15 dB up to 150 GHz. These results agree with electromagnetic (EM) simulation.

UR - https://ieeexplore.ieee.org/document/9999913

U2 - 10.23919/APMC55665.2022.9999913

DO - 10.23919/APMC55665.2022.9999913

M3 - Conference paper

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BT - 2022 Asia-Pacific Microwave Conference (APMC)

PB - Institute of Electrical and Electronics Engineers

T2 - Asian Pacific Microwave Conference 2022

Y2 - 29 November 2022 through 2 December 2022

ER -

Low-return Loss Design of PCB Probe-to-Microstrip Transition for Frequencies up to 150 GHz

Abstract

Conference

ASJC Scopus subject areas

Fields of Expertise

Treatment code (Nähere Zuordnung)

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Fingerprint

CD-Laboratory for Technology guided electronic component design and characterization

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Low-return Loss Design of PCB Probe-to-Microstrip Transition for Frequencies up to 150 GHz

Abstract

Conference

ASJC Scopus subject areas

Fields of Expertise

Treatment code (Nähere Zuordnung)

Access to Document

Other files and links

Fingerprint

Projects

CD-Laboratory for Technology guided electronic component design and characterization

Cite this