Magnetic Study of Fe3O4 Nanoparticles Incorporated within Mesoporous Silicon

Petra Granitzer; Klemens Rumpf; Uma Maheswari Venkatesan; A.G. Roca; L. Cabrera; M.P. Morales; Peter Pölt; Mihaela Albu

Magnetic Study of Fe3O4 Nanoparticles Incorporated within Mesoporous Silicon

Petra Granitzer, Klemens Rumpf, Uma Maheswari Venkatesan, A.G. Roca, L. Cabrera, M.P. Morales, Peter Pölt, Mihaela Albu

Institute of Electron Microscopy and Nanoanalysis (5190)

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	K145-K151
Journal	Journal of the Electrochemical Society
Issue number	157
Publication status	Published - 2010

Treatment code (Nähere Zuordnung)

Basic - Fundamental (Grundlagenforschung)

Characterization of porous silicon with embedded ferromagnetic nanostructures by electron microscopy
Sezen, M., Chernev, B. S. & Pölt, P.
1/01/09 → 31/12/23
Project: Research project

Cite this

@article{f3df505ad20940bfbe8d4207dd90a738,

title = "Magnetic Study of Fe3O4 Nanoparticles Incorporated within Mesoporous Silicon",

author = "Petra Granitzer and Klemens Rumpf and Venkatesan, {Uma Maheswari} and A.G. Roca and L. Cabrera and M.P. Morales and Peter P{\"o}lt and Mihaela Albu",

year = "2010",

language = "English",

pages = "K145--K151",

journal = "Journal of the Electrochemical Society",

publisher = "Electrochemical Society, Inc.",

number = "157",

}

TY - JOUR

T1 - Magnetic Study of Fe3O4 Nanoparticles Incorporated within Mesoporous Silicon

AU - Granitzer, Petra

AU - Rumpf, Klemens

AU - Venkatesan, Uma Maheswari

AU - Roca, A.G.

AU - Cabrera, L.

AU - Morales, M.P.

AU - Pölt, Peter

AU - Albu, Mihaela

PY - 2010

Y1 - 2010

M3 - Article

SP - K145-K151

JO - Journal of the Electrochemical Society

JF - Journal of the Electrochemical Society

IS - 157

ER -

Magnetic Study of Fe3O4 Nanoparticles Incorporated within Mesoporous Silicon

Treatment code (Nähere Zuordnung)

Projects

Characterization of porous silicon with embedded ferromagnetic nanostructures by electron microscopy

Cite this