Magnetism and microstructure at relevant length scales: Complementary measurements with electron and photon probes

Kannan M. Krishnan; W. Grogger; G. Kusinski; M. E. Gomez; I. Schuller; E.C. Nelson

Magnetism and microstructure at relevant length scales: Complementary measurements with electron and photon probes

Kannan M. Krishnan^*, W. Grogger, G. Kusinski, M. E. Gomez, I. Schuller, E.C. Nelson

^*Corresponding author for this work

Institute of Electron Microscopy and Nanoanalysis (5190)

Research output: Chapter in Book/Report/Conference proceeding › Conference paper › peer-review

Abstract

The magnetic properties of the materials were studied at relevant length scales. The domain structures in patterned magnetic elements were observed by using Lorentz imaging. It was shown that the advances in the development of the magentic materials depended on the ability to characterize them by a range of electron-optic and X-ray scattering/dichroism techniques.

Original language	English
Title of host publication	Digests of the Intermag Conference
Pages	EB03
Publication status	Published - 1 Dec 2002
Event	2002 IEEE International Magnetics Conference-2002 IEEE INTERMAG - Amsterdam, Netherlands Duration: 28 Apr 2002 → 2 May 2002

Conference

Conference	2002 IEEE International Magnetics Conference-2002 IEEE INTERMAG
Country/Territory	Netherlands
City	Amsterdam
Period	28/04/02 → 2/05/02

ASJC Scopus subject areas

Electrical and Electronic Engineering

Cite this

@inproceedings{776eccfa960b452f97eb70e2f1f9971b,

title = "Magnetism and microstructure at relevant length scales: Complementary measurements with electron and photon probes",

abstract = "The magnetic properties of the materials were studied at relevant length scales. The domain structures in patterned magnetic elements were observed by using Lorentz imaging. It was shown that the advances in the development of the magentic materials depended on the ability to characterize them by a range of electron-optic and X-ray scattering/dichroism techniques.",

author = "Krishnan, {Kannan M.} and W. Grogger and G. Kusinski and Gomez, {M. E.} and I. Schuller and E.C. Nelson",

year = "2002",

month = dec,

day = "1",

language = "English",

pages = "EB03",

booktitle = "Digests of the Intermag Conference",

note = "2002 IEEE International Magnetics Conference-2002 IEEE INTERMAG ; Conference date: 28-04-2002 Through 02-05-2002",

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T1 - Magnetism and microstructure at relevant length scales

T2 - 2002 IEEE International Magnetics Conference-2002 IEEE INTERMAG

AU - Krishnan, Kannan M.

AU - Grogger, W.

AU - Kusinski, G.

AU - Gomez, M. E.

AU - Schuller, I.

AU - Nelson, E.C.

PY - 2002/12/1

Y1 - 2002/12/1

N2 - The magnetic properties of the materials were studied at relevant length scales. The domain structures in patterned magnetic elements were observed by using Lorentz imaging. It was shown that the advances in the development of the magentic materials depended on the ability to characterize them by a range of electron-optic and X-ray scattering/dichroism techniques.

AB - The magnetic properties of the materials were studied at relevant length scales. The domain structures in patterned magnetic elements were observed by using Lorentz imaging. It was shown that the advances in the development of the magentic materials depended on the ability to characterize them by a range of electron-optic and X-ray scattering/dichroism techniques.

UR - http://www.scopus.com/inward/record.url?scp=0036912476&partnerID=8YFLogxK

M3 - Conference paper

AN - SCOPUS:0036912476

SP - EB03

BT - Digests of the Intermag Conference

Y2 - 28 April 2002 through 2 May 2002

ER -

Magnetism and microstructure at relevant length scales: Complementary measurements with electron and photon probes

Abstract

Conference

ASJC Scopus subject areas

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