Original language | German |
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Title of host publication | International Conference on Image Processing Theory, Tools and Applications (IPTA 2017) |
Publication status | Published - 2017 |
Markov Random Fields for Pattern Extraction in Analog Wafer Test Data
Stefan Schrunner, Olivia Bluder, Anja Zernig, Andre Kaestner, Roman Kern
Research output: Chapter in Book/Report/Conference proceeding › Conference paper › peer-review