Matching considerations for bidirectional current mirrors

Inge Siegl, Markus Haberler, Christoph Steffan

Research output: Chapter in Book/Report/Conference proceedingConference paperpeer-review

Abstract

This paper elaborates in detail which matching dynamics occur when mirroring bidirectional currents. Formulas for the matching error of bidirectional current mirrors are deduced from the unidirectional case. Simulation results confirm these calculations and verify that the matching degradation due to the bidirectional nature is stronger than the degradation due to the transistor coming into weak inversion. Depending on whether or not calibration is acceptable the paper states suitable design considerations.

Original languageEnglish
Title of host publicationProceedings - 2019 Austrochip Workshop on Microelectronics, Austrochip 2019
PublisherInstitute of Electrical and Electronics Engineers
Pages65-70
Number of pages6
ISBN (Electronic)9781728119533
DOIs
Publication statusPublished - 1 Oct 2019
Event27th Austrochip Workshop on Microelectronics: Austrochip 2019 - FH Technikum Wien, Wien, Austria
Duration: 24 Oct 201924 Oct 2019
Conference number: 27
https://embsys.technikum-wien.at/austrochip2019/
https://embsys.technikum-wien.at/austrochip2019/program/index.htm

Publication series

NameProceedings - 2019 Austrochip Workshop on Microelectronics, Austrochip 2019

Workshop

Workshop27th Austrochip Workshop on Microelectronics
Abbreviated titleAustrochip
Country/TerritoryAustria
CityWien
Period24/10/1924/10/19
Internet address

Keywords

  • CCII
  • Current conveyor
  • Current mirror
  • Matching
  • Output-stage
  • Quiescent current
  • Transimpedance amplifier
  • Weak inversion

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Instrumentation
  • Computer Networks and Communications

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