Methods for speeding up radiated and conducted immunity tests

David Pommerenke*

*Corresponding author for this work

Research output: Contribution to journalConference articlepeer-review


Different methods for reducing test time in immunity tests similar to IEC 61000-4-6 or IEC 61000-4-3 are compared. One option is to apply multiple signals at the same time. Hardware and software methods to create those signals are explained, limits and possible amplitude errors are discussed. Mode stirred chambers and methods which aim at substituting sinusoidal excitation by strong pulsed signals are not within the scope of this paper.

Original languageEnglish
Pages (from-to)587-592
Number of pages6
JournalIEEE International Symposium on Electromagnetic Compatibility
Publication statusPublished - 1 Jan 2000
Externally publishedYes
Event2000 IEEE International Symposium on Electronic Compatibility - Washington, DC, USA
Duration: 21 Aug 200025 Aug 2000

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Electrical and Electronic Engineering


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