Methods for speeding up radiated and conducted immunity tests

David Pommerenke

Methods for speeding up radiated and conducted immunity tests

^*Corresponding author for this work

Research output: Contribution to journal › Conference article › peer-review

Abstract

Different methods for reducing test time in immunity tests similar to IEC 61000-4-6 or IEC 61000-4-3 are compared. One option is to apply multiple signals at the same time. Hardware and software methods to create those signals are explained, limits and possible amplitude errors are discussed. Mode stirred chambers and methods which aim at substituting sinusoidal excitation by strong pulsed signals are not within the scope of this paper.

Original language	English
Pages (from-to)	587-592
Number of pages	6
Journal	IEEE International Symposium on Electromagnetic Compatibility
Volume	2
Publication status	Published - 1 Jan 2000
Externally published	Yes
Event	2000 IEEE International Symposium on Electronic Compatibility - Washington, DC, USA Duration: 21 Aug 2000 → 25 Aug 2000

ASJC Scopus subject areas

Condensed Matter Physics
Electrical and Electronic Engineering

Cite this

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title = "Methods for speeding up radiated and conducted immunity tests",

abstract = "Different methods for reducing test time in immunity tests similar to IEC 61000-4-6 or IEC 61000-4-3 are compared. One option is to apply multiple signals at the same time. Hardware and software methods to create those signals are explained, limits and possible amplitude errors are discussed. Mode stirred chambers and methods which aim at substituting sinusoidal excitation by strong pulsed signals are not within the scope of this paper.",

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AB - Different methods for reducing test time in immunity tests similar to IEC 61000-4-6 or IEC 61000-4-3 are compared. One option is to apply multiple signals at the same time. Hardware and software methods to create those signals are explained, limits and possible amplitude errors are discussed. Mode stirred chambers and methods which aim at substituting sinusoidal excitation by strong pulsed signals are not within the scope of this paper.

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M3 - Conference article

AN - SCOPUS:0033711325

SN - 0190-1494

VL - 2

SP - 587

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JO - IEEE International Symposium on Electromagnetic Compatibility

JF - IEEE International Symposium on Electromagnetic Compatibility

T2 - 2000 IEEE International Symposium on Electronic Compatibility

Y2 - 21 August 2000 through 25 August 2000

ER -

Methods for speeding up radiated and conducted immunity tests

Abstract

ASJC Scopus subject areas

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