Modelling of AFM-SECM systems: influence of tip geometry and insulation defects on limiting current for approach curves and images

Kelly Leonhardt, Guy Denuault, Bernhard Gollas

Research output: Contribution to conferencePoster

Original languageEnglish
Publication statusPublished - 2010
Event61st Meeting of the International Society for Electrochemistry - Nizza
Duration: 26 Sep 20101 Oct 2010

Conference

Conference61st Meeting of the International Society for Electrochemistry
CityNizza
Period26/09/101/10/10

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)
  • Theoretical

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