MoMuT::UML - model-based mutation testing for UML

Bernhard Aichernig; Harald Brandl; Elisabeth Jöbstl; Willibald Karl Krenn; Rupert Schlick; Stefan Tiran

doi:10.1109/ICST.2015.7102627

MoMuT::UML - model-based mutation testing for UML

Bernhard Aichernig, Harald Brandl, Elisabeth Jöbstl, Willibald Karl Krenn, Rupert Schlick, Stefan Tiran

Institute of Software Technology (7160)

Research output: Chapter in Book/Report/Conference proceeding › Conference paper › peer-review

Original language	English
Title of host publication	IEEE 8th Int. Conf. on Software Testing, Verification and Validation, ICST 2015
Publisher	Institute of Electrical and Electronics Engineers
Pages	1-8
DOIs	https://doi.org/10.1109/ICST.2015.7102627
Publication status	Published - 2015
Event	8th IEEE International Conference on Software Testing, Verification and Validation: ICST 2015 - Graz, Austria Duration: 13 Apr 2015 → 17 Apr 2015

Conference

Conference	8th IEEE International Conference on Software Testing, Verification and Validation
Country/Territory	Austria
City	Graz
Period	13/04/15 → 17/04/15

Fields of Expertise

Information, Communication & Computing

Access to Document

10.1109/ICST.2015.7102627

Cite this

Aichernig, B, Brandl, H, Jöbstl, E, Krenn, WK, Schlick, R & Tiran, S 2015, MoMuT::UML - model-based mutation testing for UML. in IEEE 8th Int. Conf. on Software Testing, Verification and Validation, ICST 2015. Institute of Electrical and Electronics Engineers, pp. 1-8, 8th IEEE International Conference on Software Testing, Verification and Validation, Graz, Austria, 13/04/15. https://doi.org/10.1109/ICST.2015.7102627

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title = "MoMuT::UML - model-based mutation testing for UML",

author = "Bernhard Aichernig and Harald Brandl and Elisabeth J{\"o}bstl and Krenn, {Willibald Karl} and Rupert Schlick and Stefan Tiran",

year = "2015",

doi = "10.1109/ICST.2015.7102627",

language = "English",

pages = "1--8",

booktitle = "IEEE 8th Int. Conf. on Software Testing, Verification and Validation, ICST 2015",

publisher = "Institute of Electrical and Electronics Engineers",

address = "United States",

note = "8th IEEE International Conference on Software Testing, Verification and Validation : ICST 2015 ; Conference date: 13-04-2015 Through 17-04-2015",

}

TY - GEN

T1 - MoMuT::UML - model-based mutation testing for UML

AU - Aichernig, Bernhard

AU - Brandl, Harald

AU - Jöbstl, Elisabeth

AU - Krenn, Willibald Karl

AU - Schlick, Rupert

AU - Tiran, Stefan

PY - 2015

Y1 - 2015

UR - http://www.ist.tugraz.at/aichernig/publications/papers/icst15-tools.pdf

U2 - 10.1109/ICST.2015.7102627

DO - 10.1109/ICST.2015.7102627

M3 - Conference paper

SP - 1

EP - 8

BT - IEEE 8th Int. Conf. on Software Testing, Verification and Validation, ICST 2015

PB - Institute of Electrical and Electronics Engineers

T2 - 8th IEEE International Conference on Software Testing, Verification and Validation

Y2 - 13 April 2015 through 17 April 2015

ER -

MoMuT::UML - model-based mutation testing for UML

Conference

Fields of Expertise

Access to Document

Other files and links

Formal Methods

CRYSTAL - Critical Systems Engineering Factories

EU - MBAT - Combined Model-based Analysis and Testing of Embedded Systems

Cite this

MoMuT::UML - model-based mutation testing for UML

Conference

Fields of Expertise

Access to Document

Other files and links

Projects

Formal Methods

CRYSTAL - Critical Systems Engineering Factories

EU - MBAT - Combined Model-based Analysis and Testing of Embedded Systems

Cite this