Nanoanalytical characterization of an organic photodiode by electron microscopy and atomic force microscopy

Stefanie Fladischer, A.G. Neuhold, Stefan Mitsche, E. Kraker, A. Haase, B. Lamprecht, R. Resel, Werner Grogger

Research output: Contribution to conferencePoster

Original languageEnglish
Publication statusPublished - 2010
EventInternational Conference of Organic Electronics 2010 - Paris, Frankreich
Duration: 22 Jun 201025 Jun 2010


ConferenceInternational Conference of Organic Electronics 2010
CityParis, Frankreich

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

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