Nanoanalytical characterization of an organic photodiode by electron microscopy and atomic force microscopy

Stefanie Fladischer, A.G. Neuhold, Stefan Mitsche, E. Kraker, A. Haase, B. Lamprecht, R. Resel, Werner Grogger

Research output: Contribution to conference › Poster

Original language	English
Publication status	Published - 2010
Event	International Conference of Organic Electronics 2010 - Paris, Frankreich Duration: 22 Jun 2010 → 25 Jun 2010

Conference	International Conference of Organic Electronics 2010
City	Paris, Frankreich
Period	22/06/10 → 25/06/10

Treatment code (Nähere Zuordnung)

@conference{19836a7bbf90416ab001963cb0299ce0,

title = "Nanoanalytical characterization of an organic photodiode by electron microscopy and atomic force microscopy",

author = "Stefanie Fladischer and A.G. Neuhold and Stefan Mitsche and E. Kraker and A. Haase and B. Lamprecht and R. Resel and Werner Grogger",

year = "2010",

language = "English",

note = "International Conference of Organic Electronics 2010 ; Conference date: 22-06-2010 Through 25-06-2010",

}

TY - CONF

T1 - Nanoanalytical characterization of an organic photodiode by electron microscopy and atomic force microscopy

AU - Fladischer, Stefanie

AU - Neuhold, A.G.

AU - Mitsche, Stefan

AU - Kraker, E.

AU - Haase, A.

AU - Lamprecht, B.

AU - Resel, R.

AU - Grogger, Werner

PY - 2010

Y1 - 2010

M3 - Poster

T2 - International Conference of Organic Electronics 2010

Y2 - 22 June 2010 through 25 June 2010

ER -