Phase-Resolved Near-Field Scan Over Random Fields

Tianqi Li; Victor Khilkevich; David Pommerenke

doi:10.1109/TEMC.2016.2517651

Phase-Resolved Near-Field Scan Over Random Fields

Tianqi Li, Victor Khilkevich, David Pommerenke

Research output: Contribution to journal › Article › peer-review

Abstract

This letter discusses an averaging technique for phase-resolved scanning of the fields generated by multiple uncorrelated stochastic sources. This method can separate the field contribution of each noise source into the resulting field patterns as if the sources that are not of interest were turned off. The scanned data can be used to localize the emission sources and to calculate the far-field pattern and total radiated power.

Original language	English
Article number	7412710
Pages (from-to)	506-511
Number of pages	6
Journal	IEEE Transactions on Electromagnetic Compatibility
Volume	58
Issue number	2
DOIs	https://doi.org/10.1109/TEMC.2016.2517651
Publication status	Published - 1 Apr 2016
Externally published	Yes

Keywords

Electromagnetic compatibility
emission source microscopy
far field
near-field scan
random fields

ASJC Scopus subject areas

Atomic and Molecular Physics, and Optics
Condensed Matter Physics
Electrical and Electronic Engineering

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10.1109/TEMC.2016.2517651

Cite this

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Phase-Resolved Near-Field Scan Over Random Fields

Abstract

Keywords

ASJC Scopus subject areas

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