Abstract
With recent advances in aberration corrected electron optics, scanning transmission electron microscopy (STEM) has proven its excellent capability of characterising nanomaterials. In principle, with STEM chemical information can be extracted at the level of individual atoms. Due to the high current densities occurring in a highly focused electron beam, however, interpretation of STEM data is often impeded by continuous beam induced sample changes. This is especially true for systems with a high percentage of weakly bound surface or interface atoms, which is characteristic for nanoscaled materials
| Original language | English |
|---|---|
| Pages | 1100 |
| Publication status | Published - 2020 |
| Event | Virtual Early Career European Microscopy Congress 2020: EMC 2020 - Virtuell, United Kingdom Duration: 24 Nov 2020 → 26 Nov 2020 https://www.emc2020.eu/virtual-conference/conference-programme.html |
Conference
| Conference | Virtual Early Career European Microscopy Congress 2020 |
|---|---|
| Abbreviated title | EMC 2020 |
| Country/Territory | United Kingdom |
| Period | 24/11/20 → 26/11/20 |
| Internet address |
ASJC Scopus subject areas
- General Materials Science
Fields of Expertise
- Advanced Materials Science
Treatment code (Nähere Zuordnung)
- Basic - Fundamental (Grundlagenforschung)