Photocharge-modulated passive intermodulation on AgO/Ag junction in high-power microwave devices

Xiong Chen; Yongning He; David J. Pommerenke; Jun Fan

doi:10.1109/LMWC.2020.2971829

Photocharge-modulated passive intermodulation on AgO/Ag junction in high-power microwave devices

Xiong Chen^*, Yongning He, David J. Pommerenke, Jun Fan

^*Corresponding author for this work

Institute of Electronics (4390)

Research output: Contribution to journal › Article › peer-review

Abstract

This letter studies the photocharge-modulated passive intermodulation (PIM) effect on the Ag₂O/Ag contact junction. It is demonstrated that the photocharge with the parasitic parameters on the contact junction can modulate the electron transport process and make the PIM components changed with photoillumination. The linear RC constant can change the nonlinear current strength, under the periodical photostimulation, and PIM components will vary with the photopulses. In the experiment, by using a specially designed coaxial fixture to measure the PIM response with RC components on the contact junction, a semianalytical model for this photoeffect-modulated contact PIM is demonstrated.

Original language	English
Article number	9001207
Pages (from-to)	268-271
Number of pages	4
Journal	IEEE Microwave and Wireless Components Letters
Volume	30
Issue number	3
DOIs	https://doi.org/10.1109/LMWC.2020.2971829
Publication status	Published - 1 Mar 2020

Keywords

Contact nonlinearity
passive intermodulation (PIM)
photocharge modulation
silver oxide

ASJC Scopus subject areas

Condensed Matter Physics
Electrical and Electronic Engineering

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10.1109/LMWC.2020.2971829

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title = "Photocharge-modulated passive intermodulation on AgO/Ag junction in high-power microwave devices",

abstract = "This letter studies the photocharge-modulated passive intermodulation (PIM) effect on the Ag2O/Ag contact junction. It is demonstrated that the photocharge with the parasitic parameters on the contact junction can modulate the electron transport process and make the PIM components changed with photoillumination. The linear RC constant can change the nonlinear current strength, under the periodical photostimulation, and PIM components will vary with the photopulses. In the experiment, by using a specially designed coaxial fixture to measure the PIM response with RC components on the contact junction, a semianalytical model for this photoeffect-modulated contact PIM is demonstrated.",

keywords = "Contact nonlinearity, passive intermodulation (PIM), photocharge modulation, silver oxide",

author = "Xiong Chen and Yongning He and Pommerenke, {David J.} and Jun Fan",

year = "2020",

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doi = "10.1109/LMWC.2020.2971829",

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T1 - Photocharge-modulated passive intermodulation on AgO/Ag junction in high-power microwave devices

AU - Chen, Xiong

AU - He, Yongning

AU - Pommerenke, David J.

AU - Fan, Jun

PY - 2020/3/1

Y1 - 2020/3/1

N2 - This letter studies the photocharge-modulated passive intermodulation (PIM) effect on the Ag2O/Ag contact junction. It is demonstrated that the photocharge with the parasitic parameters on the contact junction can modulate the electron transport process and make the PIM components changed with photoillumination. The linear RC constant can change the nonlinear current strength, under the periodical photostimulation, and PIM components will vary with the photopulses. In the experiment, by using a specially designed coaxial fixture to measure the PIM response with RC components on the contact junction, a semianalytical model for this photoeffect-modulated contact PIM is demonstrated.

AB - This letter studies the photocharge-modulated passive intermodulation (PIM) effect on the Ag2O/Ag contact junction. It is demonstrated that the photocharge with the parasitic parameters on the contact junction can modulate the electron transport process and make the PIM components changed with photoillumination. The linear RC constant can change the nonlinear current strength, under the periodical photostimulation, and PIM components will vary with the photopulses. In the experiment, by using a specially designed coaxial fixture to measure the PIM response with RC components on the contact junction, a semianalytical model for this photoeffect-modulated contact PIM is demonstrated.

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KW - passive intermodulation (PIM)

KW - photocharge modulation

KW - silver oxide

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M3 - Article

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JO - IEEE Microwave and Wireless Components Letters

JF - IEEE Microwave and Wireless Components Letters

IS - 3

M1 - 9001207

ER -

Photocharge-modulated passive intermodulation on AgO/Ag junction in high-power microwave devices

Abstract

Keywords

ASJC Scopus subject areas

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