Post-test analysis of silicon poisoning and phase decomposition in the SOFC cathode material La0.58Sr0.4Co0.2Fe0.8O3−δ by transmission electron microscopy

Edith Bucher; Christian Gspan; Ferdinand Hofer; Werner Sitte

doi:10.1016/j.ssi.2012.08.013

Post-test analysis of silicon poisoning and phase decomposition in the SOFC cathode material La0.58Sr0.4Co0.2Fe0.8O3−δ by transmission electron microscopy

Edith Bucher, Christian Gspan, Ferdinand Hofer, Werner Sitte

Institute of Electron Microscopy and Nanoanalysis (5190)

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	7-11
Journal	Solid State Ionics
Volume	230
DOIs	https://doi.org/10.1016/j.ssi.2012.08.013
Publication status	Published - 2013

Fields of Expertise

Advanced Materials Science

Treatment code (Nähere Zuordnung)

Basic - Fundamental (Grundlagenforschung)

Access to Document

10.1016/j.ssi.2012.08.013

Cite this

@article{3f4d4081e4584c3db7f12065a847a6a6,

title = "Post-test analysis of silicon poisoning and phase decomposition in the SOFC cathode material La0.58Sr0.4Co0.2Fe0.8O3−δ by transmission electron microscopy",

author = "Edith Bucher and Christian Gspan and Ferdinand Hofer and Werner Sitte",

year = "2013",

doi = "10.1016/j.ssi.2012.08.013",

language = "English",

volume = "230",

pages = "7--11",

journal = "Solid State Ionics",

publisher = "Elsevier B.V.",

}

TY - JOUR

T1 - Post-test analysis of silicon poisoning and phase decomposition in the SOFC cathode material La0.58Sr0.4Co0.2Fe0.8O3−δ by transmission electron microscopy

AU - Bucher, Edith

AU - Gspan, Christian

AU - Hofer, Ferdinand

AU - Sitte, Werner

PY - 2013

Y1 - 2013

U2 - 10.1016/j.ssi.2012.08.013

DO - 10.1016/j.ssi.2012.08.013

M3 - Article

VL - 230

SP - 7

EP - 11

JO - Solid State Ionics

JF - Solid State Ionics

ER -