Powered system-level conductive TLP probing method for ESD/EMI hard fail and soft fail threshold evaluation

Thomas Schwingshackl, Benjamin Orr, Joost Willemen, Werner Simbürger, Harald Gossner, Wolfgang Bösch, David Pommerenke

Research output: Chapter in Book/Report/Conference proceedingConference paperpeer-review


In this paper an advanced system-level TLP probing technique is presented to evaluate the ESD and EMI performance of a powered system applicable to high speed interfaces. It allows to detect hardware and software fail thresholds to assess the performance of an ESD/EMI protection solution. The method is demonstrated on a Intel mobile phone reference platform.

Original languageEnglish
Title of host publicationElectrical Overstress/Electrostatic Discharge Symposium Proceedings, EOS/ESD 2013
Publication statusPublished - 16 Oct 2013
Event35th Annual Electrical Overstress/Electrostatic Discharge Symposium: EOS/ESD 2013 - Las Vegas, United States
Duration: 8 Sept 201313 Sept 2013

Publication series

NameElectrical Overstress/Electrostatic Discharge Symposium Proceedings
ISSN (Print)0739-5159


Conference35th Annual Electrical Overstress/Electrostatic Discharge Symposium
Country/TerritoryUnited States
CityLas Vegas

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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