TY - JOUR
T1 - Practical Multiple Persistent Faults Analysis.
AU - Soleimany, Hadi
AU - Bagheri, Nasour
AU - Hadipour, Hosein
AU - Ravi, Prasanna
AU - Bhasin, Shivam
AU - Mansouri, Sara
N1 - DBLP's bibliographic metadata records provided through http://dblp.org/search/publ/api are distributed under a Creative Commons CC0 1.0 Universal Public Domain Dedication. Although the bibliographic metadata records are provided consistent with CC0 1.0 Dedication, the content described by the metadata records is not. Content may be subject to copyright, rights of privacy, rights of publicity and other restrictions.
PY - 2022
Y1 - 2022
N2 - We focus on the multiple persistent faults analysis in this paper to fill existing gaps in its application in a variety of scenarios. Our major contributions are twofold. First, we propose a novel technique to apply persistent fault apply in the multiple persistent faults setting that decreases the number of survived keys and the required data. We demonstrate that by utilizing 1509 and 1448 ciphertexts, the number of survived keys after performing persistent fault analysis on AES in the presence of eight and sixteen faults can be reduced to only 29 candidates, whereas the best known attacks need 2008 and 1643 ciphertexts, respectively, with a time complexity of 250. Second, we develop generalized frameworks for retrieving the key in the ciphertext-only model. Our methods for both performing persistent fault attacks and key-recovery processes are highly flexible and provide a general trade-off between the number of required ciphertexts and the time complexity. To break AES with 16 persistent faults in the Sbox, our experiments show that the number of required ciphertexts can be decreased to 477 while the attack is still practical with respect to the time complexity. To confirm the accuracy of our methods, we performed several simulations as well as experimental validations on the ARM Cortex-M4 microcontroller with electromagnetic fault injection on AES and LED, which are two well-known block ciphers to validate the types of faults and the distribution of the number of faults in practice.
AB - We focus on the multiple persistent faults analysis in this paper to fill existing gaps in its application in a variety of scenarios. Our major contributions are twofold. First, we propose a novel technique to apply persistent fault apply in the multiple persistent faults setting that decreases the number of survived keys and the required data. We demonstrate that by utilizing 1509 and 1448 ciphertexts, the number of survived keys after performing persistent fault analysis on AES in the presence of eight and sixteen faults can be reduced to only 29 candidates, whereas the best known attacks need 2008 and 1643 ciphertexts, respectively, with a time complexity of 250. Second, we develop generalized frameworks for retrieving the key in the ciphertext-only model. Our methods for both performing persistent fault attacks and key-recovery processes are highly flexible and provide a general trade-off between the number of required ciphertexts and the time complexity. To break AES with 16 persistent faults in the Sbox, our experiments show that the number of required ciphertexts can be decreased to 477 while the attack is still practical with respect to the time complexity. To confirm the accuracy of our methods, we performed several simulations as well as experimental validations on the ARM Cortex-M4 microcontroller with electromagnetic fault injection on AES and LED, which are two well-known block ciphers to validate the types of faults and the distribution of the number of faults in practice.
KW - Fault Attack
KW - Persistent Fault Analysis
KW - Multiple Faults
KW - AES
UR - http://www.scopus.com/inward/record.url?scp=85130855764&partnerID=8YFLogxK
U2 - 10.46586/TCHES.V2022.I1.367-390
DO - 10.46586/TCHES.V2022.I1.367-390
M3 - Article
SN - 2569-2925
VL - 2022
SP - 367
EP - 390
JO - IACR Transactions on Cryptographic Hardware and Embedded Systems
JF - IACR Transactions on Cryptographic Hardware and Embedded Systems
IS - 1
ER -