Prediction of Electrostatic Discharge (ESD) soft error on two-way radio using ESD simulation in CST and ESD immunity scanning technique

Rosnah Antong, Danny Low, David Pommerenke, Mohd Zaid Abdullah

Research output: Chapter in Book/Report/Conference proceedingConference paperpeer-review


Electrostatic Discharge (ESD) can cause ESD soft error failures such as radio reset. In this paper, a new methodology is developed to assess ESD risk at system level prior to PCB fabrication using 3D simulation. A Poynting vector theorem is used to calculate the accumulated incident power received by the sensitive IC which is identified through ESD immunity scanning test. The time-weighted-Average peak power is to establish the criteria for ESD risk causing the soft error failure. Results from this paper will help electrical engineer to predict potential ESD reset failure at system level instead of the previously trial-And-error procedure.

Original languageEnglish
Title of host publication2014 IEEE 36th International Electronics Manufacturing Technology Conference, IEMT 2014
PublisherInstitute of Electrical and Electronics Engineers
ISBN (Electronic)9781479982097
Publication statusPublished - 12 Jun 2015
Externally publishedYes
Event36th IEEE International Electronics Manufacturing Technology Conference: IEMT 2014 - Johor, Malaysia
Duration: 11 Nov 201413 Nov 2014

Publication series

NameProceedings of the IEEE/CPMT International Electronics Manufacturing Technology (IEMT) Symposium
ISSN (Print)1089-8190


Conference36th IEEE International Electronics Manufacturing Technology Conference

ASJC Scopus subject areas

  • Industrial and Manufacturing Engineering
  • Electrical and Electronic Engineering

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