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Abstract
Implementation attacks like side-channel and fault attacks pose a considerable threat to cryptographic devices that are physically accessible by an attacker. As a consequence, devices like smart cards implement corresponding countermeasures like redundant computation and masking. Recently, statistical ineffective fault attacks (SIFA) have been shown to be able to circumvent these classical countermeasure techniques. We present a new approach for verifying the SIFA protection of arbitrary masked implementations in both hardware and software. The proposed method uses Boolean dependency analysis, factorization, and known properties of masked computations to show whether the fault detection mechanism of redundant masked circuits can leak information about the processed secret values. We implemented this new method in a tool called Danira, which can show the SIFA resistance of cryptographic implementations like AES S-Boxes within minutes.
Original language | English |
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Pages (from-to) | 471-481 |
Number of pages | 11 |
Journal | Innovations in Systems and Software Engineering |
Volume | 18 |
Issue number | 3 |
DOIs | |
Publication status | Published - Sept 2022 |
Keywords
- statistical ineffective fault attack
- fault analysis
- masking
- fault detection
- security proofs
- Fault attacks
- SIFA
- Masking
- Verification
ASJC Scopus subject areas
- Software
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Dive into the research topics of 'Proving SIFA protection of masked redundant circuits'. Together they form a unique fingerprint.Projects
- 1 Finished
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FERMION - Formal Verification of Masked Hardware Implementations
2/01/19 → 1/01/22
Project: Research project
Research output
- 1 Conference paper
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Proving SIFA Protection of Masked Redundant Circuits
Hadžić, V., Primas, R. & Bloem, R., 2021, Automated Technology for Verification and Analysis: 19th International Symposium, ATVA 2021. Hou, Z. & Ganesh, V. (eds.). Cham: Springer, p. 249-265 16 p. (Lecture Notes in Computer Science; vol. 12971).Research output: Chapter in Book/Report/Conference proceeding › Conference paper › peer-review
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