Abstract
Aberration-corrected scanning transmission electron microscopy (STEM) allows the imaging of single atoms in bulk crystals, usually with high angle annular dark field (HAADF) images [1], but in special cases also with STEM spectroscopy methods [2]. However, the detection of single atoms in a bulk crystal is challenging and depends on various experimental parameters such as specimen thickness, crystal orientation, composition of the matrix and the type of dopants. For substitutional dopants, the channeling of the electron waves in the crystal must be considered, whereas for single atoms on interstitial sites such as in porous materials, other difficulties such as the electron probe confinement arise [3].
Original language | English |
---|---|
Pages | 553-554 |
Publication status | Published - 2023 |
Event | Microscopy Conference 2023: MC 2023 - Damstadt, Germany Duration: 26 Feb 2023 → 2 Mar 2023 https://www.microscopy-conference.de/ |
Conference
Conference | Microscopy Conference 2023 |
---|---|
Abbreviated title | MC 2023 |
Country/Territory | Germany |
City | Damstadt |
Period | 26/02/23 → 2/03/23 |
Internet address |
ASJC Scopus subject areas
- General Materials Science
Fields of Expertise
- Advanced Materials Science
Treatment code (Nähere Zuordnung)
- Basic - Fundamental (Grundlagenforschung)