Radiated Immunity Testing of Integrated Circuits in Reverberation Chambers

R. Heinrich, R. Bechly, Bernd Deutschmann

Research output: Chapter in Book/Report/Conference proceeding › Conference paper › peer-review

Original language	English
Title of host publication	International Symposium on Electromagnetic Compatibility
Place of Publication	Piscataway, NY
Publisher	Institute of Electrical and Electronics Engineers
Pages	1-4
ISBN (Print)	978-1-4673-0718-5
DOIs	https://doi.org/10.1109/EMCEurope.2012.6396877
Publication status	Published - 2012
Event	International Symposium on Electromagnetic Compatibility: EMC EUROPE 2012 - Rome, Italy Duration: 17 Sept 2012 → 21 Sept 2012

Conference	International Symposium on Electromagnetic Compatibility
Country/Territory	Italy
City	Rome
Period	17/09/12 → 21/09/12

Fields of Expertise

Heinrich, R, Bechly, R & Deutschmann, B 2012, Radiated Immunity Testing of Integrated Circuits in Reverberation Chambers. in International Symposium on Electromagnetic Compatibility. Institute of Electrical and Electronics Engineers, Piscataway, NY, pp. 1-4, International Symposium on Electromagnetic Compatibility, Rome, Italy, 17/09/12. https://doi.org/10.1109/EMCEurope.2012.6396877

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