RELIABLE QUANTIFICATION OF X-RAY SPECTRA USING ζ-FACTORS: FROM STANDARDS TO GEOMETRY

Johanna Kraxner; Lukas Konrad; Daniel Knez; Angelina Orthacker; Sebastian Rauch; Manuel Paller; Gerald Kothleitner; Werner Grogger

RELIABLE QUANTIFICATION OF X-RAY SPECTRA USING ζ-FACTORS: FROM STANDARDS TO GEOMETRY

Johanna Kraxner, Lukas Konrad, Daniel Knez, Angelina Orthacker, Sebastian Rauch, Manuel Paller, Gerald Kothleitner, Werner Grogger

Institute of Electron Microscopy and Nanoanalysis (5190)

Research output: Chapter in Book/Report/Conference proceeding › Conference paper › peer-review

Original language	English
Title of host publication	Multinational Congress on Microscopy
Publisher	.
Pages	O-239-80-82
Publication status	Published - 2015
Event	Multinational Congress on Microscopy - Eger, Hungary Duration: 23 Aug 2015 → 28 Aug 2015

Conference

Conference	Multinational Congress on Microscopy
Country/Territory	Hungary
City	Eger
Period	23/08/15 → 28/08/15

Fields of Expertise

Advanced Materials Science

Treatment code (Nähere Zuordnung)

Basic - Fundamental (Grundlagenforschung)

Cite this

@inproceedings{314b7e2f9a60426a9b2e3b0d4e6eeb9a,

title = "RELIABLE QUANTIFICATION OF X-RAY SPECTRA USING ζ-FACTORS: FROM STANDARDS TO GEOMETRY",

author = "Johanna Kraxner and Lukas Konrad and Daniel Knez and Angelina Orthacker and Sebastian Rauch and Manuel Paller and Gerald Kothleitner and Werner Grogger",

year = "2015",

language = "English",

pages = "O--239--80--82",

booktitle = "Multinational Congress on Microscopy",

publisher = ".",

note = "Multinational Congress on Microscopy ; Conference date: 23-08-2015 Through 28-08-2015",

}

TY - GEN

T1 - RELIABLE QUANTIFICATION OF X-RAY SPECTRA USING ζ-FACTORS: FROM STANDARDS TO GEOMETRY

AU - Kraxner, Johanna

AU - Konrad, Lukas

AU - Knez, Daniel

AU - Orthacker, Angelina

AU - Rauch, Sebastian

AU - Paller, Manuel

AU - Kothleitner, Gerald

AU - Grogger, Werner

PY - 2015

Y1 - 2015

M3 - Conference paper

SP - O-239-80-82

BT - Multinational Congress on Microscopy

PB - .

T2 - Multinational Congress on Microscopy

Y2 - 23 August 2015 through 28 August 2015

ER -