Removing the effects of elastic and thermal scattering from spectrum images in scanning transmission electron microscopy

N.R. Lugg, M.J. Neish, M. Haruta, Gerald Kothleitner, Werner Grogger, Ferdinand Hofer, K. Kimoto, T. Mizoguchi, S.D. Findlay, L.J. Allen

Research output: Chapter in Book/Report/Conference proceedingConference paperpeer-review

Original languageEnglish
Title of host publicationMicroscopy for Global Challenges
Publication statusPublished - 2014
EventInternational Microscopy Congress 2014 - Prag Tschechische Republik
Duration: 7 Sept 201412 Sept 2014


ConferenceInternational Microscopy Congress 2014
CityPrag Tschechische Republik

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

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