Require, Test and Trace IT

Bernhard Aichernig; Klaus Hörmaier; Florian Lukas Lorber; Dejan Nickovic; Stefan Tiran

doi:10.1007/978-3-319-19458-5_8

Require, Test and Trace IT

Bernhard Aichernig, Klaus Hörmaier, Florian Lukas Lorber, Dejan Nickovic, Stefan Tiran

Institute of Software Engineering and Artificial Intelligence (7160)

Research output: Chapter in Book/Report/Conference proceeding › Conference paper › peer-review

Original language	English
Title of host publication	Formal Methods for Industrial Critical Systems
Place of Publication	Cham
Publisher	Springer
Pages	113-127
ISBN (Print)	978-3-319-19457-8
DOIs	https://doi.org/10.1007/978-3-319-19458-5_8
Publication status	Published - 2015
Event	International Workshop on Formal Methods for Industrial Critical Systems - Oslo, Norway Duration: 22 Jun 2015 → 23 Jun 2015

Publication series

Name	Lecture Notes in Computer Science
Publisher	Springer
Volume	9128

Conference

Conference	International Workshop on Formal Methods for Industrial Critical Systems
Country/Territory	Norway
City	Oslo
Period	22/06/15 → 23/06/15

Fields of Expertise

Information, Communication & Computing

Access to Document

10.1007/978-3-319-19458-5_8

Cite this

@inproceedings{5915aaad6fe24b0585c8853cb51d43b6,

title = "Require, Test and Trace IT",

author = "Bernhard Aichernig and Klaus H{\"o}rmaier and Lorber, {Florian Lukas} and Dejan Nickovic and Stefan Tiran",

year = "2015",

doi = "10.1007/978-3-319-19458-5_8",

language = "English",

isbn = "978-3-319-19457-8",

series = "Lecture Notes in Computer Science",

publisher = "Springer",

pages = "113--127",

booktitle = "Formal Methods for Industrial Critical Systems",

note = "International Workshop on Formal Methods for Industrial Critical Systems ; Conference date: 22-06-2015 Through 23-06-2015",

}

TY - GEN

T1 - Require, Test and Trace IT

AU - Aichernig, Bernhard

AU - Hörmaier, Klaus

AU - Lorber, Florian Lukas

AU - Nickovic, Dejan

AU - Tiran, Stefan

PY - 2015

Y1 - 2015

UR - http://www.ist.tugraz.at/aichernig/publications/papers/fmics15.pdf

U2 - 10.1007/978-3-319-19458-5_8

DO - 10.1007/978-3-319-19458-5_8

M3 - Conference paper

SN - 978-3-319-19457-8

T3 - Lecture Notes in Computer Science

SP - 113

EP - 127

BT - Formal Methods for Industrial Critical Systems

PB - Springer

CY - Cham

T2 - International Workshop on Formal Methods for Industrial Critical Systems

Y2 - 22 June 2015 through 23 June 2015

ER -

Require, Test and Trace IT

Publication series

Conference

Fields of Expertise

Access to Document

Other files and links

CRYSTAL - Critical Systems Engineering Factories

EU - MBAT - Combined Model-based Analysis and Testing of Embedded Systems

Cite this

Require, Test and Trace IT

Publication series

Conference

Fields of Expertise

Access to Document

Other files and links

Projects

CRYSTAL - Critical Systems Engineering Factories

EU - MBAT - Combined Model-based Analysis and Testing of Embedded Systems

Cite this