Robust Local Features and their Application in Self-Calibration and Object Recognition on Embedded Systems

Clemens Arth, Christian Leistner, Horst Bischof

Research output: Chapter in Book/Report/Conference proceedingConference paperpeer-review

Original languageEnglish
Title of host publicationProceedings of Workshop on Embedded Computer Vision
PublisherInstitute of Electrical and Electronics Engineers
Publication statusPublished - 2007
Event2006 IEEE Conference on Computer Vision and Pattern Recognition: CVPR 2006 - New York, United States
Duration: 17 Jun 200622 Jun 2006


Conference2006 IEEE Conference on Computer Vision and Pattern Recognition
Country/TerritoryUnited States
CityNew York

Treatment code (Nähere Zuordnung)

  • Application

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