Robust mTRL implementation for probing standards manufactured on PCBs

Michael E. Gadringer

doi:10.1109/ARFTG52261.2021.9640218

Robust mTRL implementation for probing standards manufactured on PCBs

Michael E. Gadringer

Institute of Microwave and Photonic Engineering (4510)

Research output: Chapter in Book/Report/Conference proceeding › Conference paper › peer-review

Abstract

The Through-Reflect-Line (TRL) and multiline-TRL (mTRL) calibration are well known for accurate parameterization of the systematic errors of a vector network analyzer (VNA). When applying this approach to calibration/deembedding in connection with PCBs tested on a probe station, the imperfections of the RF probe to PCB transitions add to the overall measurement uncertainty. These measurement imperfections may result in an incorrect output of the mTRL algorithm due to faulty measurements. To mitigate this situation, an implementation of the mTRL calibration is presented which, on the one hand, focuses on a robust implementation able to cope with mentioned measurement conditions and, on the other hand, tags possible improper measurements.

Original language	English
Title of host publication	97th ARFTG Microwave Measurement Conference
Subtitle of host publication	Conducted and Ota Measurement Challenges for Urban, Rural and SatComm Connectivity, ARFTG 2021
Publisher	IEEE Publications
Pages	1-4
Number of pages	4
ISBN (Electronic)	9780738112480
ISBN (Print)	978-1-6654-4794-2
DOIs	https://doi.org/10.1109/ARFTG52261.2021.9640218
Publication status	Published - 25 Jun 2021
Event	97th ARFTG Microwave Measurement Conference: Conducted and Ota Measurement Challenges for Urban, Rural and SatComm Connectivity: ARFTG 2021 - Virtual, Atlanta, United States Duration: 25 Jun 2021 → 25 Jun 2021

Publication series

Name	97th ARFTG Microwave Measurement Conference: Conducted and Ota Measurement Challenges for Urban, Rural and SatComm Connectivity, ARFTG 2021

Conference

Conference	97th ARFTG Microwave Measurement Conference: Conducted and Ota Measurement Challenges for Urban, Rural and SatComm Connectivity
Abbreviated title	ARFTG 2021
Country/Territory	United States
City	Virtual, Atlanta
Period	25/06/21 → 25/06/21

Keywords

Radio frequency
Uncertainty
Systematics
Measurement uncertainty
Network analyzers
Calibration
Propagation constant
MTRL
S-parameters
VNA
Planar substrates
PCB
On-wafer

ASJC Scopus subject areas

Instrumentation
Electrical and Electronic Engineering
Computer Networks and Communications

Fields of Expertise

Information, Communication & Computing

Treatment code (Nähere Zuordnung)

Experimental

Access to Document

10.1109/ARFTG52261.2021.9640218

https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=9640218

Cite this

Gadringer, M. E. (2021). Robust mTRL implementation for probing standards manufactured on PCBs. In 97th ARFTG Microwave Measurement Conference: Conducted and Ota Measurement Challenges for Urban, Rural and SatComm Connectivity, ARFTG 2021 (pp. 1-4). Article 9640218 (97th ARFTG Microwave Measurement Conference: Conducted and Ota Measurement Challenges for Urban, Rural and SatComm Connectivity, ARFTG 2021). IEEE Publications. https://doi.org/10.1109/ARFTG52261.2021.9640218

Robust mTRL implementation for probing standards manufactured on PCBs. / Gadringer, Michael E.
97th ARFTG Microwave Measurement Conference: Conducted and Ota Measurement Challenges for Urban, Rural and SatComm Connectivity, ARFTG 2021. IEEE Publications, 2021. p. 1-4 9640218 (97th ARFTG Microwave Measurement Conference: Conducted and Ota Measurement Challenges for Urban, Rural and SatComm Connectivity, ARFTG 2021).

Research output: Chapter in Book/Report/Conference proceeding › Conference paper › peer-review

Gadringer, ME 2021, Robust mTRL implementation for probing standards manufactured on PCBs. in 97th ARFTG Microwave Measurement Conference: Conducted and Ota Measurement Challenges for Urban, Rural and SatComm Connectivity, ARFTG 2021., 9640218, 97th ARFTG Microwave Measurement Conference: Conducted and Ota Measurement Challenges for Urban, Rural and SatComm Connectivity, ARFTG 2021, IEEE Publications, pp. 1-4, 97th ARFTG Microwave Measurement Conference: Conducted and Ota Measurement Challenges for Urban, Rural and SatComm Connectivity, Virtual, Atlanta, Georgia, United States, 25/06/21. https://doi.org/10.1109/ARFTG52261.2021.9640218

Gadringer ME. Robust mTRL implementation for probing standards manufactured on PCBs. In 97th ARFTG Microwave Measurement Conference: Conducted and Ota Measurement Challenges for Urban, Rural and SatComm Connectivity, ARFTG 2021. IEEE Publications. 2021. p. 1-4. 9640218. (97th ARFTG Microwave Measurement Conference: Conducted and Ota Measurement Challenges for Urban, Rural and SatComm Connectivity, ARFTG 2021). doi: 10.1109/ARFTG52261.2021.9640218

Gadringer, Michael E. / Robust mTRL implementation for probing standards manufactured on PCBs. 97th ARFTG Microwave Measurement Conference: Conducted and Ota Measurement Challenges for Urban, Rural and SatComm Connectivity, ARFTG 2021. IEEE Publications, 2021. pp. 1-4 (97th ARFTG Microwave Measurement Conference: Conducted and Ota Measurement Challenges for Urban, Rural and SatComm Connectivity, ARFTG 2021).

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title = "Robust mTRL implementation for probing standards manufactured on PCBs",

abstract = "The Through-Reflect-Line (TRL) and multiline-TRL (mTRL) calibration are well known for accurate parameterization of the systematic errors of a vector network analyzer (VNA). When applying this approach to calibration/deembedding in connection with PCBs tested on a probe station, the imperfections of the RF probe to PCB transitions add to the overall measurement uncertainty. These measurement imperfections may result in an incorrect output of the mTRL algorithm due to faulty measurements. To mitigate this situation, an implementation of the mTRL calibration is presented which, on the one hand, focuses on a robust implementation able to cope with mentioned measurement conditions and, on the other hand, tags possible improper measurements.",

keywords = "Radio frequency, Uncertainty, Systematics, Measurement uncertainty, Network analyzers, Calibration, Propagation constant, MTRL, S-parameters, VNA, Planar substrates, PCB, On-wafer",

author = "Gadringer, {Michael E.}",

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AB - The Through-Reflect-Line (TRL) and multiline-TRL (mTRL) calibration are well known for accurate parameterization of the systematic errors of a vector network analyzer (VNA). When applying this approach to calibration/deembedding in connection with PCBs tested on a probe station, the imperfections of the RF probe to PCB transitions add to the overall measurement uncertainty. These measurement imperfections may result in an incorrect output of the mTRL algorithm due to faulty measurements. To mitigate this situation, an implementation of the mTRL calibration is presented which, on the one hand, focuses on a robust implementation able to cope with mentioned measurement conditions and, on the other hand, tags possible improper measurements.

KW - Radio frequency

KW - Uncertainty

KW - Systematics

KW - Measurement uncertainty

KW - Network analyzers

KW - Calibration

KW - Propagation constant

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KW - S-parameters

KW - VNA

KW - Planar substrates

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ER -

Robust mTRL implementation for probing standards manufactured on PCBs

Abstract

Publication series

Conference

Keywords

ASJC Scopus subject areas

Fields of Expertise

Treatment code (Nähere Zuordnung)

Access to Document

Other files and links

CD-Laboratory for Technology guided electronic component design and characterization

Microwave and mm-wave measurement techniques

The Automatic RF Techniques Group - Best Oral Presentation Award

mm-Wave Complex Permittivity Extraction of LTCC Substrate Under the Influence of Surface Roughness

Cite this

Robust mTRL implementation for probing standards manufactured on PCBs

Abstract

Publication series

Conference

Keywords

ASJC Scopus subject areas

Fields of Expertise

Treatment code (Nähere Zuordnung)

Access to Document

Other files and links

Projects

CD-Laboratory for Technology guided electronic component design and characterization

Microwave and mm-wave measurement techniques

Prizes

The Automatic RF Techniques Group - Best Oral Presentation Award

Research output

mm-Wave Complex Permittivity Extraction of LTCC Substrate Under the Influence of Surface Roughness

Cite this